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Humboldt-Universität zu Berlin - Mathematisch-Naturwissen­schaft­liche Fakultät - SFB 951 - HIOS

Z2

HIOS structure and morphology characterization

Objectives

The first funding period has reinforced the need for a coherent set of advanced tools for the (nano-) structural characterization of HIOS. Besides (cryo-) transmission electron microscopy (TEM), X-ray diffraction (XRD) techniques, as well as other direct-space methods [atomic force microscopy (AFM) and related techniques, scanning electron microscopy (SEM)] will be employed in a concerted approach. The required investigations require state-of-the-art measurements specifically adapted to HIOS, and include extensive data analyses. Since this type of service is needed across the CRC, these characterization techniques for HIOS will be now bundled in and managed through Z2.
 

Principal Investigators


kowarik.jpeg

Stefan Kowarik

030 2093 4818

stefan.kowarikphysik.hu-berlin.de

kochc.jpg

Christoph Koch

030 2093 7652

Christoph.Kochhu-berlin.de

 

Postdoctoral Researchers


zykov.jpg

Anton Zykov

030 2093 4803

anton.zykovphysik.hu-berlin.de

kirmse.jpg

Holm Kirmse

030 2093 7641

holm.kirmsephysik.hu-berlin.de

vandenbroek.jpg

Wouter van den Broek

030 2093 7937

wouter.vandenbroekphysik.hu-berlin.de

Zdravko Kochovski

030 2093 4995

kochovskhu-berlin.de

Peter Schäfer

030 2093 7894

peter.schaeferhu-berlin.de

Nikolai Severin

030 2093 7832

nikolai.severinphysik.hu-berlin.de

Amin Pavizi

030 2093 7658

amin.paviziphysik.hu-berlin.de


Institutions:        FHI-Logo        HZB-Logo          Uni Potsdam-Logo          TU Berlin-Logo         HU Berlin-Logo

            IRIS Logo              Funded by:       DFG Logo