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Humboldt-Universität zu Berlin - Mathematisch-Naturwissen­schaft­liche Fakultät - SFB 951 - HIOS

Z2

HIOS structure and morphology characterization

Objectives

This central project provides characterization services by various electron beam based techniques, obtaining information about atomic and electronic structure on hybrid inorganic/organic systems (HIOS) produced within the CRC. Using scientific equipment some of which has only very recently been purchased or built during the second funding period of the CRC a wide range of electron imaging, diffraction and spectroscopy techniques covering a very wide range of electron beam energies (5 kV – 200 kV) will be applied. This includes imaging and mapping of composition at atomic resolution, mapping of local crystal structure and orientation of beam-sensitive HIOS at electron beam energies down to 5 keV, mapping of plasmonic eigenmodes, electron-beam lithography, as well as many other techniques available to scanning electron microscopy, or (scanning) transmission electron microscopy.

 

Principal Investigators


kochc.jpg

Christoph Koch

030 2093 7652

Christoph.Kochhu-berlin.de

 

Postdoctoral Researchers


kirmse.jpg

Holm Kirmse

030 2093 7641

holm.kirmsephysik.hu-berlin.de

vandenbroek.jpg

Wouter van den Broek

030 2093 7937

wouter.vandenbroekphysik.hu-berlin.de

kochovski.jpg

Zdravko Kochovski

030 2093 4995

kochovskphysik.hu-berlin.de

eljarrat.jpg

Alberto Eljarrat Ascunce

030 2093 7734

alberto.eljarratphysik.hu-berlin.de


Institutions:

FHI-Logo    HZB-Logo    IRIS Logo      Uni Potsdam-Logo    FU Logo    TU Berlin-Logo      HU Berlin-Logo

 

 

Funded by:  DFG Logo