Humboldt-Universität zu Berlin - Faculty of Mathematics and Natural Sciences - Strukturforschung / Elektronenmikroskopie

Publications

2022

A. Khorsand Kheirabad, X. Pan, S. Long, Z. Kochovski, S. Zhou, Y. Lu, G. McInerney, J. Yuan
Colloidal dispersion of poly(ionic liquid)/Cu composite particles for protective surface coating against SAR‐CoV‐2
[article] Nano Select 3 1 227-232 DOI:10.1002/nano.202100069

D. Burmeister, H.A. Tran, J. Müller, M. Guerrini, C. Cocchi, J. Plaickner, Z. Kochovski, E.J.W. List‐Kratochvil, M.J. Bojdys
Optimized Synthesis of Solution‐Processable Crystalline Poly(Triazine Imide) with Minimized Defects for OLED Application
[article] Angewandte Chemie International Edition 61 3 DOI:10.1002/anie.202111749

D. Yagodkin, K. Greben, A. Eljarrat, S. Kovalchuk, M. Ghorbani‐Asl, M. Jain, S. Kretschmer, N. Severin, J.P. Rabe, A.V. Krasheninnikov, C.T. Koch, K.I. Bolotin
Extrinsic Localized Excitons in Patterned 2D Semiconductors
[article] Advanced Functional Materials 2203060 DOI:10.1002/adfm.202203060

W. Aggoune, A. Eljarrat, D. Nabok, K. Irmscher, M. Zupancic, Z. Galazka, M. Albrecht, C. Koch, C. Draxl
A consistent picture of excitations in cubic BaSnO3 revealed by combining theory and experiment
[article] Communications Materials 3 1 12 DOI:10.1038/s43246-022-00234-6

Y. Zhao, R.M. Sarhan, A. Eljarrat, Z. Kochovski, C. Koch, B. Schmidt, W. Koopman, Y. Lu
Surface-Functionalized Au–Pd Nanorods with Enhanced Photothermal Conversion and Catalytic Performance
[article] ACS Applied Materials & Interfaces 14 15 17259-17272 DOI:10.1021/acsami.2c00221

J. Huang, A. Martin, A. Urbanski, R. Kulkarni, P. Amsalem, M. Exner, G. Li, J. Müller, D. Burmeister, N. Koch, T. Brezesinski, N. Pinna, P. Uhlmann, M.J. Bojdys
One‐pot synthesis of high‐capacity silicon anodes via on‐copper growth of a semiconducting, porous polymer
[article] Natural Sciences 2 3 DOI:10.1002/ntls.20210105

D. Xie, Y. Xu, Y. Wang, X. Pan, E. Härk, Z. Kochovski, A. Eljarrat, J. Müller, C.T. Koch, J. Yuan, Y. Lu
Poly(ionic liquid) Nanovesicle-Templated Carbon Nanocapsules Functionalized with Uniform Iron Nitride Nanoparticles as Catalytic Sulfur Host for Li–S Batteries
[article] ACS Nano acsnano.2c01992 DOI:10.1021/acsnano.2c01992

D. Burmeister, J. Müller, J. Plaickner, Z. Kochovski, E.J.W. List‐Kratochvil, M.J. Bojdys
Size Effects of the Anions in the Ionothermal Synthesis of Carbon Nitride Materials
[article] Chemistry – A European Journal 28 33 DOI:10.1002/chem.202200705

K. Tetzner, R. Schewski, A. Popp, S.B. Anooz, T. Chou, I. Ostermay, H. Kirmse, J. Würfl
Refractory metal-based ohmic contacts on β-Ga2O3 using TiW
[article] APL Materials 10 7 071108 DOI:10.1063/5.0094661

2021

J. Schlipf, H. Tetzner, D. Spirito, C.L. Manganelli, G. Capellini, M.R.S. Huang, C.T. Koch, C.J. Clausen, A. Elsayed, M. Oehme, S. Chiussi, J. Schulze, I.A. Fischer
Raman shifts in MBE‐grown SixGe1 − x − y Sny alloys with large Si content
[article] Journal of Raman Spectroscopy 52 6 1167-1175 DOI:10.1002/jrs.6098

M.R.S. Huang, A. Eljarrat, C.T. Koch
Quantifying the data quality of focal series for inline electron holography
[article] Ultramicroscopy 113264 DOI:10.1016/j.ultramic.2021.113264

J. Seo, C.T. Koch, S. Ryu, C. Eom, S.H. Oh
Analysis of Local Charges at Hetero-interfaces by Electron Holography – A Comparative Study of Different Techniques
[article] Ultramicroscopy 113236 DOI:10.1016/j.ultramic.2021.113236

C.M. O'Leary, B. Haas, C.T. Koch, P.D. Nellist, L. Jones
Increasing Spatial Fidelity and SNR of 4D-STEM Using Multi-Frame Data Fusion
[article] Microscopy and Microanalysis 1-11 DOI:10.1017/S1431927621012587

R. Kulkarni, J. Huang, M. Trunk, D. Burmeister, P. Amsalem, J. Müller, A. Martin, N. Koch, D. Kass, M.J. Bojdys
Direct growth of crystalline triazine-based graphdiyne using surface-assisted deprotection–polymerisation
[article] Chemical Science 12 38 12661-12666 DOI:10.1039/D1SC03390E

Y. Yang, S.Y. Wang, B. Xiang, S. Yin, T.C. Pekin, X. Li, R. Zhang, K. Yano, D. Hwang, M. Asta, C. Grigoropoulos, F.I. Allen, A.M. Minor
Evaluating the effects of pillar shape and gallium ion beam damage on the mechanical properties of single crystal aluminum nanopillars
[article] Journal of Materials Research 36 12 2515-2528 DOI:10.1557/s43578-021-00125-5

B.H. Savitzky, S.E. Zeltmann, L.A. Hughes, H.G. Brown, S. Zhao, P.M. Pelz, T.C. Pekin, E.S. Barnard, J. Donohue, L. Rangel DaCosta, E. Kennedy, Y. Xie, M.T. Janish, M.M. Schneider, P. Herring, C. Gopal, A. Anapolsky, R. Dhall, K.C. Bustillo, P. Ercius, M.C. Scott, J. Ciston, A.M. Minor, C. Ophus
py4DSTEM: A Software Package for Four-Dimensional Scanning Transmission Electron Microscopy Data Analysis
[article] Microscopy and Microanalysis 27 4 712-743 DOI:10.1017/S1431927621000477

K.A. Messalea, N. Syed, A. Zavabeti, M. Mohiuddin, A. Jannat, P. Aukarasereenont, C.K. Nguyen, M.X. Low, S. Walia, B. Haas, C.T. Koch, N. Mahmood, K. Khoshmanesh, K. Kalantar-Zadeh, T. Daeneke
High-k 2D Sb2O3 Made Using a Substrate-Independent and Low-Temperature Liquid-Metal-Based Process
[article] ACS Nano 15 10 16067-16075 DOI:10.1021/acsnano.1c04631

B. Haas, A. Mittelberger, C. Meyer, B. Plotkin-Swing, N. Dellby, O. Krivanek, T. Lovejoy, C. Koch
High-Fidelity 4D-STEM Enabled by Live Processing at 15’000 Detector Frames Per Second
[conference proceedings] Microscopy and Microanalysis 27 S1 994-997 DOI:10.1017/S1431927621003779

T. Pekin, M. Schloz, B. Haas, W. Van den Broek, C. Koch
Improving 4DSTEM measurements of atomic charge and electrostatic potential via energy filtration
[conference proceedings] Microscopy and Microanalysis 27 S1 1450-1452 DOI:10.1017/S1431927621005365

A. Mittelberger, B. Haas, B. Plotkin-Swing, C. Meyer, N. Dellby, L. Piazza, O. Krivanek, C. Koch, T. Lovejoy
5D-STEM: Live processing and display at 15,000 diffraction patterns per second
[conference proceedings] Microscopy and Microanalysis 27 S1 1064-1065 DOI:10.1017/S1431927621004013

N. Wolff, S. Fichtner, B. Haas, M.R. Islam, F. Niekiel, M. Kessel, O. Ambacher, C. Koch, B. Wagner, F. Lofink, L. Kienle
Atomic scale confirmation of ferroelectric polarization inversion in wurtzite-type AlScN
[article] Journal of Applied Physics 129 3 034103 DOI:10.1063/5.0033205

M. Wurdack, T. Yun, E. Estrecho, N. Syed, S. Bhattacharyya, M. Pieczarka, A. Zavabeti, S. Chen, B. Haas, J. Müller, M.N. Lockrey, Q. Bao, C. Schneider, Y. Lu, M.S. Fuhrer, A.G. Truscott, T. Daeneke, E.A. Ostrovskaya
Ultrathin Ga2O3 Glass: A Large‐Scale Passivation and Protection Material for Monolayer WS2
[article] Advanced Materials 33 3 2005732 DOI:10.1002/adma.202005732

B. Daudin, A. Siladie, M. Gruart, M. den Hertog, C. Bougerol, B. Haas, J. Rouvière, E. Robin, M. Recio-Carretero, N. Garro, A. Cros
The role of surface diffusion in the growth mechanism of III-nitride nanowires and nanotubes
[article] Nanotechnology 32 8 085606 DOI:10.1088/1361-6528/abc780

R. Jäger, P. Teppor, M. Paalo, M. Härmas, A. Adamson, O. Volobujeva, E. Härk, Z. Kochovski, T. Romann, R. Härmas, J. Aruväli, A. Kikas, E. Lust
Synthesis and Characterization of Cobalt and Nitrogen Co-Doped Peat-Derived Carbon Catalysts for Oxygen Reduction in Acidic Media
[article] Catalysts 11 6 715 DOI:10.3390/catal11060715

K. Dong, Y. Xu, J. Tan, M. Osenberg, F. Sun, Z. Kochovski, D.T. Pham, S. Mei, A. Hilger, E. Ryan, Y. Lu, J. Banhart, I. Manke
Unravelling the Mechanism of Lithium Nucleation and Growth and the Interaction with the Solid Electrolyte Interface
[article] ACS Energy Letters 6 5 1719-1728 DOI:10.1021/acsenergylett.1c00551

D. Xie, S. Mei, Y. Xu, T. Quan, E. Härk, Z. Kochovski, Y. Lu
Efficient Sulfur Host Based on Yolk‐Shell Iron Oxide/Sulfide‐Carbon Nanospindles for Lithium‐Sulfur Batteries
[article] ChemSusChem 14 5 1404-1413 DOI:10.1002/cssc.202002731

W. Cao, J. Zhou, Z. Kochovski, H. Miao, Z. Gao, J. Sun, J. Yuan
Ionic organic cage-encapsulated metal clusters for switchable catalysis
[article] Cell Reports Physical Science 2 9 100546 DOI:10.1016/j.xcrp.2021.100546

J. Yang, A. Acharjya, M. Ye, J. Rabeah, S. Li, Z. Kochovski, S. Youk, J. Roeser, J. Grüneberg, C. Penschke, M. Schwarze, T. Wang, Y. Lu, R. Krol, M. Oschatz, R. Schomäcker, P. Saalfrank, A. Thomas
Protonated Imine‐Linked Covalent Organic Frameworks for Photocatalytic Hydrogen Evolution
[article] Angewandte Chemie International Edition 60 36 19797-19803 DOI:10.1002/anie.202104870

Y. Zhao, A. Opitz, A. Eljarrat, Z. Kochovski, C.T. Koch, N. Koch, Y. Lu
Kinetic Study on the Adsorption of 2,3,5,6-Tetrafluoro-7,7,8,8-tetracyanoquinodimethane on Ag Nanoparticles in Chloroform: Implications for the Charge Transfer Complex of Ag–F $_\textrm4$ TCNQ
[article] ACS Applied Nano Materials 4 11 11625-11635 DOI:10.1021/acsanm.1c02153

R. Liu, R. Zhang, L. Li, Z. Kochovski, L. Yao, M. Nieh, Y. Lu, T. Shi, G. Chen
A Comprehensive Landscape for Fibril Association Behaviors Encoded Synergistically by Saccharides and Peptides
[article] Journal of the American Chemical Society 143 17 6622-6633 DOI:10.1021/jacs.1c01951

R.R. Zamani, F.S. Hage, A. Eljarrat, L. Namazi, Q.M. Ramasse, K.A. Dick
Unraveling electronic band structure of narrow-bandgap p–n nanojunctions in heterostructured nanowires
[article] Physical Chemistry Chemical Physics 23 44 25019-25023 DOI:10.1039/D1CP03275E

2020

A. Martinez-Sanchez, Z. Kochovski, U. Laugks, J. Meyer zum Alten Borgloh, S. Chakraborty, S. Pfeffer, W. Baumeister, V. Lučić
Template-free detection and classification of membrane-bound complexes in cryo-electron tomograms
[article] Nature Methods DOI:10.1038/s41592-019-0675-5

F. Wang, A. Eljarrat, J. Müller, T.R. Henninen, R. Erni, C.T. Koch
Multi-resolution convolutional neural networks for inverse problems
[article] Scientific Reports 10 1 5730 DOI:10.1038/s41598-020-62484-z

A. Faghani, M.F. Gholami, M. Trunk, J. Müller, P. Pachfule, S. Vogl, I. Donskyi, M. Li, P. Nickl, J. Shao, M.R.S. Huang, W.E.S. Unger, R. Arenal, C.T. Koch, B. Paulus, J.P. Rabe, A. Thomas, R. Haag, M. Adeli
Metal-Assisted and Solvent-Mediated Synthesis of Two-Dimensional Triazine Structures on Gram Scale
[article] Journal of the American Chemical Society 142 30 12976-12986 DOI:10.1021/jacs.0c02399

H. Funk, O. Shargaieva, A. Eljarrat, E.L. Unger, C.T. Koch, D. Abou-Ras
In Situ TEM Monitoring of Phase-Segregation in Inorganic Mixed Halide Perovskite
[article] The Journal of Physical Chemistry Letters 11 13 4945-4950 DOI:10.1021/acs.jpclett.0c01296

A. Cruz, F. Ruske, A. Eljarrat, P.P. Michalowski, A.B. Morales-Vilches, S. Neubert, E. Wang, C.T. Koch, B. Szyszka, R. Schlatmann, B. Stannowski
Influence of Silicon Layers on the Growth of ITO and AZO in Silicon Heterojunction Solar Cells
[article] IEEE Journal of Photovoltaics 10 2 703-709 DOI:10.1109/JPHOTOV.2019.2957665

I.A. Fischer, C.J. Clausen, D. Schwarz, P. Zaumseil, G. Capellini, M. Virgilio, M.C. da Silva Figueira, S. Birner, S. Koelling, P.M. Koenraad, M.R.S. Huang, C.T. Koch, T. Wendav, K. Busch, J. Schulze
Composition analysis and transition energies of ultrathin Sn-rich GeSn quantum wells
[article] Physical Review Materials 4 2 024601 DOI:10.1103/PhysRevMaterials.4.024601

S. Gholami, M. Dimde, D. Braatz, J. Müller, R. Haag, O. Wagner
Reusable biopolymer based heavy metal filter as plant protection for phytoremediation
[article] Environmental Technology & Innovation 19 101005 DOI:10.1016/j.eti.2020.101005

M. Schloz, T.C. Pekin, Z. Chen, W. Van den Broek, D.A. Muller, C.T. Koch
Overcoming information reduced data and experimentally uncertain parameters in ptychography with regularized optimization
[article] Optics Express 28 19 28306 DOI:10.1364/OE.396925

A. Abolhosseini Shahrnoy, A.R. Mahjoub, S. Shokrollahi, N. Ezzati, K. Elsner, C.T. Koch
Step‐by‐step synthesis of copper(I) complex supported on platinum nanoparticle‐decorated mesoporous silica hollow spheres and its remarkable catalytic performance in Sonogashira coupling reaction
[article] Applied Organometallic Chemistry 34 7 DOI:10.1002/aoc.5645

K. Herman, H. Kirmse, A. Eljarrat, C.T. Koch, S. Kirstein, J.P. Rabe
Individual tubular J-aggregates stabilized and stiffened by silica encapsulation
[article] Colloid and Polymer Science 298 7 937-950 DOI:10.1007/s00396-020-04661-0

M. Rothe, Y. Zhao, J. Müller, G. Kewes, C.T. Koch, Y. Lu, O. Benson
Self-Assembly of Plasmonic Nanoantenna–Waveguide Structures for Subdiffractional Chiral Sensing
[article] ACS Nano acsnano.0c05240 DOI:10.1021/acsnano.0c05240

J. Müller, B. Haas, W. Van den Broek, S. Shabih, C.T. Koch
Features of Our SEM Transmission Diffraction Sub-stage with 6-axis Sample Control and a Camera with Variable Camera Length
[conference proceedings] Microscopy and Microanalysis 26 S2 1906-1907 DOI:10.1017/S1431927620019789

T. Lovejoy, B. Plotkin-Swing, N. Dellby, C. Meyer, A. Mittelberger, A. Eljarrat, B. Haas, C. Koch, O. Krivanek
Angle-Resolved Electron Energy Loss Spectroscopy
[conference proceedings] Microscopy and Microanalysis 26 S2 964-965 DOI:10.1017/S1431927620016505

O. Krivanek, A. Dohnalkova, Z. Kochovski, B. Haas, J. Müller, N. Dellby, M. Hotz, A. Mittelberger, B. Plotkin-Swing, T. Lovejoy, C. Koch
Damage-free Analysis of Biological Materials by Vibrational Spectroscopy in the EM
[conference proceedings] Microscopy and Microanalysis 26 S2 108-110 DOI:10.1017/S1431927620013409

C. Koch, D. Weber, A. Clausen, A. Mittelberger, S. Shabih, J. Müller, B. Haas, A. Eljarrat, J. Weinrich, C. Meyer
Streamlining Processing and Utilization of EM Data - An Efficient Open-source Solution
[conference proceedings] Microscopy and Microanalysis 26 S2 2946-2948 DOI:10.1017/S1431927620023302

B. Haas, M. Schloz, A. Mittelberger, T. Lovejoy, J. Müller, O. Krivanek, L. Jones, W. Van den Broek, C. Koch
Comparison of Ptychography vs. Center-of-mass Analysis of Registered 4D-STEM Series
[conference proceedings] Microscopy and Microanalysis 26 S2 1898-1900 DOI:10.1017/S1431927620019765

R. Liu, Z. Kochovski, L. Li, Y. Yin, J. Yang, G. Yang, G. Tao, A. Xu, E. Zhang, H. Ding, Y. Lu, G. Chen, M. Jiang
Fabrication of Pascal‐triangle Lattice of Proteins by Inducing Ligand Strategy
[article] Angewandte Chemie 132 24 9704-9710 DOI:10.1002/ange.202000771

E. Maron, Z. Kochovski, R.N. Zuckermann, H.G. Börner
Peptide-Assisted Design of Peptoid Sequences: One Small Step in Structure and Distinct Leaps in Functions
[article] ACS Macro Letters 9 2 233-237 DOI:10.1021/acsmacrolett.9b00977

T. Quan, Y. Xu, M. Tovar, N. Goubard‐Bretesché, Z. Li, Z. Kochovski, H. Kirmse, K. Skrodczky, S. Mei, H. Yu, D. Abou‐Ras, M. Wagemaker, Y. Lu
Hollow MoS $_\textrm3$ Nanospheres as Electrode Material for “Water‐in‐Salt” Li–Ion Batteries
[article] Batteries & Supercaps 3 8 747-756 DOI:10.1002/batt.202000042

P. Teppor, R. Jäger, M. Paalo, R. Palm, O. Volobujeva, E. Härk, Z. Kochovski, T. Romann, R. Härmas, J. Aruväli, A. Kikas, E. Lust
Peat-derived carbon-based non-platinum group metal type catalyst for oxygen reduction and evolution reactions
[article] Electrochemistry Communications 113 106700 DOI:10.1016/j.elecom.2020.106700

Z. Kochovski, G. Chen, J. Yuan, Y. Lu
Cryo-Electron microscopy for the study of self-assembled poly(ionic liquid) nanoparticles and protein supramolecular structures
[article] Colloid and Polymer Science 298 7 707-717 DOI:10.1007/s00396-020-04657-w

P. Teppor, R. Jäger, E. Härk, S. Sepp, M. Kook, O. Volobujeva, P. Paiste, Z. Kochovski, I. Tallo, E. Lust
Exploring Different Synthesis Parameters for the Preparation of Metal-Nitrogen-Carbon Type Oxygen Reduction Catalysts
[article] Journal of The Electrochemical Society 167 5 054513 DOI:10.1149/1945-7111/ab7093

R. Jäger, P. Teppor, E. Härk, M. Härmas, A. Adamson, M. Paalo, O. Volobujeva, A. Kikas, Z. Kochovski, T. Romann, R. Härmas, E. Lust
Cobalt and Nitrogen Co-Doped Peat Derived Carbon Based Catalysts for Oxygen Reduction
[article] ECS Transactions 97 7 605-613 DOI:10.1149/09707.0605ecst

2019

F. Madzharova, Á. Nodar, V. Živanović, M.R.S. Huang, C.T. Koch, R. Esteban, J. Aizpurua, J. Kneipp
Gold‐ and Silver‐Coated Barium Titanate Nanocomposites as Probes for Two‐Photon Multimodal Microspectroscopy
[article] Advanced Functional Materials 1904289 DOI:10.1002/adfm.201904289

B. Haas, J. Rouvière, V. Boureau, R. Berthier, D. Cooper
Direct comparison of off-axis holography and differential phase contrast for the mapping of electric fields in semiconductors by transmission electron microscopy.
[article] Ultramicroscopy 198 58-72 DOI:10.1016/j.ultramic.2018.12.003

S. Fairman, J. Müller, C.T. Koch
Crystallography in the Scanning Electron Microscope
[conference proceedings] Proceedings of the Microscopy Conference 2019 in Berlin, Germany

H. Kirmse, S. Sadofev, S. Blumstengel, C.T. Koch
Challenges of HRTEM image contrast simulation of MoS2/TaS2 heterostructure
[conference proceedings] Proceedings of the Microscopy Conference 2019 in Berlin, Germany

C.T. Koch, K. Skudler, F. Peschel, T.S. Bechtel, T.C. Pekin, Y.P. Ivanov, A.L. Greer
Construction of structural models of amorphous materials from TEM images or diffraction patterns: the example of a metallic glass
[conference proceedings] Proceedings of the Microscopy Conference 2019 in Berlin, Germany

M. Mousley, S. Eswara, J.-. Audinot, O. Bouton, O. De Castro, N. Klinger, C.T. Koch, G. Hlawacek, T. Wirtz
Sub 50 keV helium ions as an imaging probe in transmission microscopy and secondary ion mass spectrometry
[conference proceedings] Proceedings of the Microscopy Conference 2019 in Berlin, Germany

A. Eljarrat, H. Funk, O. Shargaieva, E. Unger, D. Abou-Ras, C.T. Koch
In-situ TEM observation of phase transformations in inorganic cesium-lead-halide perovskites using multivariate analysis
[conference proceedings] Proceedings of the Microscopy Conference 2019 in Berlin, Germany

M.R.S. Huang, C.T. Koch, A. Eljarrat
Influence of the experimental setup on inline electron holography reconstructions
[conference proceedings] Proceedings of the Microscopy Conference 2019 in Berlin, Germany

H. Kirmse, B. Jenichen, E. Willinger, X. Huang, B. Haas, C.T. Koch
TEM-based analysis of the crystal structure of a Ge-rich layer sandwiched between spintronic Fe3Si
[conference proceedings] Proceedings of the Microscopy Conference 2019 in Berlin, Germany

B. Haas, J. Müller, C.T. Koch
4D-STEM characterization of materials in a transmission-SEM
[conference proceedings] Proceedings of the Microscopy Conference 2019 in Berlin, Germany

A. Eljarrat, C.T. Koch
Including the zero-loss peak and plural scattering in the quantitative analysis of low-loss EELS
[conference proceedings] Proceedings of the Microscopy Conference 2019 in Berlin, Germany

Z. Kochovski, G. Yang, W. Zhang, G. Chen, J. Yuan, Y. Lu
Insights into protein and polymer self-assembly by Cryo-TEM
[conference proceedings] Proceedings of the Microscopy Conference 2019 in Berlin, Germany

J. Müller, B. Haas, S. Shabih, C.T. Koch
Features of our newly developed SEM diffraction stage with 6-axis sample control and a camera with variable camera length
[conference proceedings] Proceedings of the Microscopy Conference 2019 in Berlin, Germany

T.C. Pekin, C. Gammer, C. Ophus, R. Ritchie, A.M. Minor
Four dimensional scanning transmission electron microscopy during the in-situ annealing of a CuZrAl bulk metallic glass
[conference proceedings] Proceedings of the Microscopy Conference 2019 in Berlin, Germany

R.S. Pennington, C.T. Koch
User-friendly, admin-friendly robust data storage and sharing platform: the DIADEM project
[conference proceedings] Proceedings of the Microscopy Conference 2019 in Berlin, Germany

R.S. Pennington, T. Ober, J.-. Zou, Y.-. Shao, C.T. Koch
Quantitative structural optimization in multiple dimensions against transmission electron diffraction data
[conference proceedings] Proceedings of the Microscopy Conference 2019 in Berlin, Germany

M. Schloz, T.C. Pekin, W. Van den Broek, C.T. Koch
Regularized optimization for ptychography – a gradient based ptychographic reconstruction algorithm
[conference proceedings] Proceedings of the Microscopy Conference 2019 in Berlin, Germany

W. Van den Broek, B.W. Reed, A. Béché, J. Verbeeck, C.T. Koch
Investigation of dose reduction in TEM through compressed sensing
[conference proceedings] Proceedings of the Microscopy Conference 2019 in Berlin, Germany

J. Weinrich, A. Mogilatenko, F. Brunner, M. Weyers, C.T. Koch
On the dislocation inclination and strain in Si-doped GaN
[conference proceedings] Proceedings of the Microscopy Conference 2019 in Berlin, Germany

J. Weinrich, A. Mogilatenko, F. Brunner, C.T. Koch, M. Weyers
Extra half-plane shortening of dislocations as an origin of tensile strain in Si-doped (Al)GaN
[article] Journal of Applied Physics 126 8 085701 DOI:10.1063/1.5111664

A. Eljarrat, C.T. Koch
Design and application of a relativistic Kramers–Kronig analysis algorithm
[article] Ultramicroscopy 206 112825 DOI:10.1016/j.ultramic.2019.112825

W. Van den Broek, B.W. Reed, A. Beche, A. Velazco, J. Verbeeck, C.T. Koch
Various Compressed Sensing Setups Evaluated Against Shannon Sampling Under Constraint of Constant Illumination
[article] IEEE Transactions on Computational Imaging 5 3 502-514 DOI:10.1109/TCI.2019.2894950

N. Mutz, T. Meisel, H. Kirmse, S. Park, N. Severin, J.P. Rabe, E. List-Kratochvil, N. Koch, C.T. Koch, S. Blumstengel, S. Sadofev
Pulsed thermal deposition of binary and ternary transition metal dichalcogenide monolayers and heterostructures
[article] Applied Physics Letters 114 16 162101 DOI:10.1063/1.5088758

M. Mousley, S. Eswara, O. De Castro, O. Bouton, N. Klingner, C.T. Koch, G. Hlawacek, T. Wirtz
Stationary beam full-field transmission helium ion microscopy using sub-50 keV He+: Projected images and intensity patterns
[article] Beilstein Journal of Nanotechnology 10 1648-1657 DOI:10.3762/bjnano.10.160

D. Mutruc, A. Goulet-Hanssens, S. Fairman, S. Wahl, A. Zimathies, C. Knie, S. Hecht
Modulating Guest Uptake in Core-Shell MOFs with Visible Light
[article] Angewandte Chemie International Edition DOI:10.1002/anie.201906606

S. Caicedo-Dávila, H. Funk, R. Lovrinčić, C. Müller, M. Sendner, O. Cojocaru-Mirédin, F. Lehmann, R. Gunder, A. Franz, S. Levcenco, A.V. Cohen, L. Kronik, B. Haas, C.T. Koch, D. Abou-Ras
Spatial Phase Distributions in Solution-Based and Evaporated Cs–Pb–Br Thin Films
[article] The Journal of Physical Chemistry C 123 29 17666-17677 DOI:10.1021/acs.jpcc.9b02567

M. Rothe, Y. Zhao, G. Kewes, Z. Kochovski, W. Sigle, P.A. van Aken, C. Koch, M. Ballauff, Y. Lu, O. Benson
Silver nanowires with optimized silica coating as versatile plasmonic resonators
[article] Scientific Reports 9 1 DOI:10.1038/s41598-019-40380-5

P. Rajak, C.T. Koch, S. Bhattacharyya
Removal of supporting amorphous carbon film induced artefact from measured strain variation within a nanoparticle
[article] Ultramicroscopy 199 70-80 DOI:10.1016/j.ultramic.2019.02.012

S. Zhang, Z. Kochovski, H. Lee, Y. Lu, H. Zhang, J. Zhang, J. Sun, J. Yuan
Ionic organic cage-encapsulating phase-transferable metal clusters
[article] Chemical Science DOI:10.1039/C8SC04375B

Z. Li, S. Chen, C. Gao, Z. Yang, K. Shih, Z. Kochovski, G. Yang, L. Gou, M. Nieh, M. Jiang, L. Zhang, G. Chen
Chemically Controlled Helical Polymorphism in Protein Tubes by Selective Modulation of Supramolecular Interactions
[article] Journal of the American Chemical Society 141 49 19448-19457 DOI:10.1021/jacs.9b10505

G. Yang, W. Zheng, G. Tao, L. Wu, Q. Zhou, Z. Kochovski, T. Ji, H. Chen, X. Li, Y. Lu, H. Ding, H. Yang, G. Chen, M. Jiang
Diversiform and Transformable Glyco-Nanostructures Constructed from Amphiphilic Supramolecular Metallocarbohydrates through Hierarchical Self-Assembly: The Balance between Metallacycles and Saccharides
[article] ACS Nano 13 11 13474-13485 DOI:10.1021/acsnano.9b07134

S. Mei, Z. Kochovski, R. Roa, S. Gu, X. Xu, H. Yu, J. Dzubiella, M. Ballauff, Y. Lu
Enhanced Catalytic Activity of Gold-Polydopamine Nanoreactors with Multi-compartment Structure Under NIR Irradiation
[article] Nano-Micro Letters 11 1 83 DOI:10.1007/s40820-019-0314-9

H. Yu, T. Quan, S. Mei, Z. Kochovski, W. Huang, H. Meng, Y. Lu
Prompt Electrodeposition of Ni Nanodots on Ni Foam to Construct a High-Performance Water-Splitting Electrode: Efficient, Scalable, and Recyclable
[article] Nano-Micro Letters 11 1 41 DOI:10.1007/s40820-019-0269-x

T. Quan, N. Goubard‐Bretesché, E. Härk, Z. Kochovski, S. Mei, N. Pinna, M. Ballauff, Y. Lu
Highly Dispersible Hexagonal Carbon–MoS2 –Carbon Nanoplates with Hollow Sandwich Structures for Supercapacitors
[article] Chemistry – A European Journal 25 18 4757-4766 DOI:10.1002/chem.201806060

M. Khodeir, B. Ernould, J. Brassinne, S. Ghiassinejad, H. Jia, S. Antoun, C. Friebe, U.S. Schubert, Z. Kochovski, Y. Lu, E. Van Ruymbeke, J. Gohy
Synthesis and characterisation of redox hydrogels based on stable nitroxide radicals
[article] Soft Matter 15 31 6418-6426 DOI:10.1039/C9SM00905A

N. Al Nakeeb, Z. Kochovski, T. Li, Y. Zhang, Y. Lu, B.V.K.J. Schmidt
Poly(ethylene glycol) brush-b-poly( N-vinylpyrrolidone)-based double hydrophilic block copolymer particles crosslinked via crystalline α-cyclodextrin domains
[article] RSC Advances 9 9 4993-5001 DOI:10.1039/C8RA10672J

W. Van den Broek, M. Schloz, T.C. Pekin, P.M. Pelz, P.-. Lu, M. Kruth, V. Grillo, R.E. Dunin-Borkowski, R.J.D. Miller, C.T. Koch
Towards Ptychography with Structured Illumination, and a Derivative-Based Reconstruction Algorithm
[conference proceedings] Microscopy and Microanalysis 25 S2 58-59 DOI:10.1017/S1431927619001028

W. Van den Broek, B.W. Reed, A. Béché, J. Verbeeck, C.T. Koch
Viability of Compressed Sensing as a Dose Reduction Strategy in STEM
[conference proceedings] Microscopy and Microanalysis 25 S2 1686-1687 DOI:10.1017/S1431927619009164

J. Seo, B. Park, C.T. Koch, H. Lee, J. Lee, C. Eom, S.H. Oh
Direct Observation of Field-induced Modulation of Two-dimensional Electron Gas at Oxide Interfaces
[conference proceedings] Microscopy and Microanalysis 25 S2 1848-1849 DOI:10.1017/S1431927619009978

2018

S. Fairman, C.T. Koch
Quantitative Diffraction Methods in the Scanning Electron Microscope
[conference proceedings] Proceedings of the International Microscopy Congress 19 in Sydney, Australia

B. Haas, C.T. Koch
Optimization of Two‐Dimensional Scanning Moiré Patterns for Strain Mapping by Adaptive Sampling
[conference proceedings] Proceedings of the International Microscopy Congress 19 in Sydney, Australia

B. Haas, C.T. Koch
Precession Diffraction Based Strain Mapping in STEM and SEM
[conference proceedings] Proceedings of the International Microscopy Congress 19 in Sydney, Australia

R.S. Pennington, C.T. Koch
Improved characterization and depthresolved structural optimization of ferroelectric materials using density functional theory and electron diffraction data
[conference proceedings] Proceedings of the International Microscopy Congress 19 in Sydney, Australia

A. Eljarrat, C.T. Koch
AlGaN multilayer examined by low‐loss EELS and relativistic Kramers‐Kronig analysis
[conference proceedings] Proceedings of the International Microscopy Congress 19 in Sydney, Australia

B. Haas, C.T. Koch
Simultaneous E-Field & Strain Mapping by Precession Electron Diffraction
[conference proceedings] Proceedings of the International Microscopy Congress 19 in Sydney, Australia

D. Morikawa, C.T. Koch
Lorentz TEM observation of deformed skyrmions in supercooled state
[conference proceedings] Proceedings of the International Microscopy Congress 19 in Sydney, Australia

J. Müller, C.T. Koch
Live cell imaging by quantitative phase imaging with an add‐on module for standard optical microscopes and with focal series reconstruction
[conference proceedings] Proceedings of the International Microscopy Congress 19 in Sydney, Australia

J. Müller, C.T. Koch
SEM Transmission Diffraction Stagewith 6‐axis sample control and a pixelated detector with variable camera length
[conference proceedings] Proceedings of the International Microscopy Congress 19 in Sydney, Australia

M. Schloz, C.T. Koch
Compressed sensing for reconstruction in ptychography
[conference proceedings] Proceedings of the International Microscopy Congress 19 in Sydney, Australia

W. Van den Broek, C.T. Koch
Performance evaluation of compressed sensing set-ups for optical and transmission electron microscopy
[conference proceedings] Proceedings of the International Microscopy Congress 19 in Sydney, Australia

C.T. Koch
Recent Progress in Inline Holographic Techniques in the Electron Microscope
[conference proceedings] Proceedings of the International Microscopy Congress 19 in Sydney, Australia

G. Yang, R. Hu, H. Ding, Z. Kochovski, S. Mei, Y. Lu, Y. Ma, G. Chen, M. Jiang
CO2-switchable response of protein microtubules: behaviour and mechanism
[article] Materials Chemistry Frontiers 2 9 1642-1646 DOI:10.1039/C8QM00245B

V. Živanović, Z. Kochovski, C. Arenz, Y. Lu, J. Kneipp
SERS and Cryo-EM Directly Reveal Different Liposome Structures during Interaction with Gold Nanoparticles
[article] The Journal of Physical Chemistry Letters 9 23 6767-6772 DOI:10.1021/acs.jpclett.8b03191

W. Qi, Y. Zhang, Z. Kochovski, J. Wang, Y. Lu, G. Chen, M. Jiang
Self-assembly of Human Galectin-1 via dual supramolecular interactions and its inhibition of T-cell agglutination and apoptosis
[article] Nano Research 11 10 5566-5572 DOI:10.1007/s12274-018-2169-7

W. Qi, Y. Zhang, J. Wang, G. Tao, L. Wu, Z. Kochovski, H. Gao, G. Chen, M. Jiang
Deprotection-Induced Morphology Transition and Immunoactivation of Glycovesicles: A Strategy of Smart Delivery Polymersomes
[article] Journal of the American Chemical Society 140 28 8851-8857 DOI:10.1021/jacs.8b04731

X. Xu, T. Schultz, Z. Qin, N. Severin, B. Haas, S. Shen, J.N. Kirchhof, A. Opitz, C.T. Koch, K. Bolotin, J.P. Rabe, G. Eda, N. Koch
Microstructure and Elastic Constants of Transition Metal Dichalcogenide Monolayers from Friction and Shear Force Microscopy
[article] Advanced Materials 30 39 1803748 DOI:10.1002/adma.201803748

N. Preissler, C.T. Trinh, M. Trahms, P. Sonntag, D. Abou-Ras, H. Kirmse, R. Schlatmann, B. Rech, D. Amkreutz
Impact of Dielectric Layers on Liquid-Phase Crystallized Silicon Solar Cells
[article] IEEE Journal of Photovoltaics 8 1 30-37 DOI:10.1109/JPHOTOV.2017.2768960

E. Steeg, H. Kirmse, J.P. Rabe, S. Kirstein
Silver iodide nanowires grown within tubular J-aggregates
[article] Journal of Colloid and Interface Science 530 424-432 DOI:10.1016/j.jcis.2018.06.099

N. Mutz, H. Kirmse, C.T. Koch, E.J.W. List-Kratochvil, S. Blumstengel
Energy Transfer between Cyano-Ether PPV and InGaN/GaN Quantum Wells with Large Piezoelectric Fields
[article] physica status solidi (a) DOI:10.1002/pssa.201800322

K. Song, S. Ryu, H. Lee, T.R. Paudel, C.T. Koch, B. Park, J.K. Lee, S. Choi, Y. Kim, J.C. Kim, H.Y. Jeong, M.S. Rzchowski, E.Y. Tsymbal, C. Eom, S.H. Oh
Direct imaging of the electron liquid at oxide interfaces
[article] Nature Nanotechnology DOI:10.1038/s41565-017-0040-8

R.S. Pennington, C. Coll, S. Estradé, F. Peiró, C.T. Koch
Neural-network-based depth-resolved multiscale structural optimization using density functional theory and electron diffraction data
[article] Physical Review B 97 2 DOI:10.1103/PhysRevB.97.024112

B. Jenichen, M. Hanke, S. Gaucher, A. Trampert, J. Herfort, H. Kirmse, B. Haas, E. Willinger, X. Huang, S.C. Erwin
Ordered structure of FeGe 2 formed during solid-phase epitaxy
[article] Physical Review Materials 2 5 DOI:10.1103/PhysRevMaterials.2.051402

A. Eljarrat, J. Müller, M.R.S. Huang, C.T. Koch
Multi-focus TIE algorithm including partial spatial coherence and overlapping filters
[article] Optics Express 26 9 11819 DOI:10.1364/OE.26.011819

J.K. Lee, B. Park, K. Song, W.Y. Jung, D. Tyutyunnikov, T. Yang, C.T. Koch, C.G. Park, P.A. van Aken, Y. Kim, J.K. Kim, J. Bang, L. Chen, S.H. Oh
Strain-induced indium clustering in non-polar a -plane InGaN quantum wells
[article] Acta Materialia 145 109-122 DOI:10.1016/j.actamat.2017.11.039

2017

A. Béché, H. Vanrompay, W. Van den Broek, S. Bals, J. Verbeeck
Compressed sensing in (S)TEM – imaging materials with reduced electron dose
[conference proceedings] Proceedings of the Microscopy Conference 2017 in Lausanne

A. De Backer, K.H.W. van den Bos, W. Van den Broek, J. Sijbers, S. Van Aert
StatSTEM – an efficient approach for accurate and precise modelbased quantification of atomic resolution electron microscopy images
[conference proceedings] Proceedings of the Microscopy Conference 2017 in Lausanne

B. Haas, D. Cooper, J. Rouvière
Simultaneous e-field and strain mapping by precession electron diffraction
[conference proceedings] Proceedings of the Microscopy Conference 2017 in Lausanne

H. Kirmse, M. Sparenberg, S. Blumstengel, C.T. Koch
Structure of hybrid interfaces – arrangement of organic molecules on a crystalline inorganic surface
[conference proceedings] Proceedings of the Microscopy Conference 2017 in Lausanne

J. Müller, A. Eljarrat, F. Wang, K. Blessing, C.T. Koch
Optical quantitative phase imaging by focal series reconstruction with a module attachable to microscope camera ports and with a microscope with computer-controlled z-stage
[conference proceedings] Proceedings of the Microscopy Conference 2017 in Lausanne

A. Eljarrat, J. Müller, F. Wang, C.T. Koch
Efficient holographic imaging by focus- and astigmatism-series
[conference proceedings] Proceedings of the Microscopy Conference 2017 in Lausanne

R.S. Pennington, C.T. Koch
Evaluating computational TEM specimen models for threedimensional iterative algorithms using electron diffraction data
[conference proceedings] Proceedings of the Microscopy Conference 2017 in Lausanne

W. Van den Broek, A. Parvizi, C.T. Koch
Including atomicity as prior knowledge in atomic resolution HAADFSTEM tomography by means of compressed sensing
[conference proceedings] Proceedings of the Microscopy Conference 2017 in Lausanne

W. Van den Broek, A. Parvizi, A. Béché, J. Verbeeck, C.T. Koch
The effects of dose limitation and Poisson noise on compressed sensing in HAADF-STEM
[conference proceedings] Proceedings of the Microscopy Conference 2017 in Lausanne

F. Wang, C.T. Koch
Robust structure factor retrieval from large-angle rocking-beam electron-diffraction (LARBED) patterns
[conference proceedings] Proceedings of the Microscopy Conference 2017 in Lausanne

S. Wieczorek, D. Remmler, T. Masini, Z. Kochovski, A.K.H. Hirsch, H.G. Börner
Fine-tuning Nanocarriers Specifically toward Cargo: A Competitive Study on Solubilizing Related Photosensitizers for Photodynamic Therapy
[article] Bioconjugate Chemistry 28 3 760-767 DOI:10.1021/acs.bioconjchem.6b00549

J. Sun, Z. Kochovski, W. Zhang, H. Kirmse, Y. Lu, M. Antonietti, J. Yuan
General Synthetic Route toward Highly Dispersed Metal Clusters Enabled by Poly(ionic liquid)s
[article] Journal of the American Chemical Society 139 26 8971-8976 DOI:10.1021/jacs.7b03357

Y. Yang, S. Risse, S. Mei, C.J. Jafta, Y. Lu, C. Stöcklein, N. Kardjilov, I. Manke, J. Gong, Z. Kochovski, M. Ballauff
Binder-free carbon monolith cathode material for operando investigation of high performance lithium-sulfur batteries with X-ray radiography
[article] Energy Storage Materials 9 96-104 DOI:10.1016/j.ensm.2017.06.008

G. Yang, H. Ding, Z. Kochovski, R. Hu, Y. Lu, Y. Ma, G. Chen, M. Jiang
Highly Ordered Self-Assembly of Native Proteins into 1D, 2D, and 3D Structures Modulated by the Tether Length of Assembly-Inducing Ligands
[article] Angewandte Chemie International Edition 56 36 10691-10695 DOI:10.1002/anie.201703052

L. Wu, Y. Zhang, Z. Li, G. Yang, Z. Kochovski, G. Chen, M. Jiang
“Sweet” Architecture-Dependent Uptake of Glycocalyx-Mimicking Nanoparticles Based on Biodegradable Aliphatic Polyesters by Macrophages
[article] Journal of the American Chemical Society 139 41 14684-14692 DOI:10.1021/jacs.7b07768

C. Zheng, T.C. Petersen, H. Kirmse, W. Neumann, M.J. Morgan, J. Etheridge
Axicon Lens for Electrons Using a Magnetic Vortex: The Efficient Generation of a Bessel Beam
[article] Physical Review Letters 119 17 DOI:10.1103/PhysRevLett.119.174801

A. Zeugner, M. Kaiser, P. Schmidt, T.V. Menshchikova, I.P. Rusinov, A.V. Markelov, W. Van den Broek, E.V. Chulkov, T. Doert, M. Ruck, A. Isaeva
Modular Design with 2D Topological-Insulator Building Blocks: Optimized Synthesis and Crystal Growth and Crystal and Electronic Structures of Bi x TeI (x= 2,3)
[article] Chemistry of Materials 29 3 1321-1337 DOI:10.1021/acs.chemmater.6b05038

A. Parvizi, W. Van den Broek, C.T. Koch
Recovering low spatial frequencies in wavefront sensing based on intensity measurements
[article] Advanced Structural and Chemical Imaging 2 1 DOI:10.1186/s40679-016-0017-y

2016

G. Yang, Z. Kochovski, Z. Ji, Y. Lu, G. Chen, M. Jiang
Three-dimensional protein assemblies directed by orthogonal non-covalent interactions
[article] Chem. Commun. 52 62 9687-9690 DOI:10.1039/C6CC04250C

D. Cordella, A. Debuigne, C. Jérôme, Z. Kochovski, D. Taton, C. Detrembleur
One-Pot Synthesis of Double Poly(Ionic Liquid) Block Copolymers by Cobalt-Mediated Radical Polymerization-Induced Self-Assembly (CMR-PISA) in Water
[article] Macromolecular Rapid Communications 37 14 1181-1187 DOI:10.1002/marc.201600039

S. Wieczorek, A. Dallmann, Z. Kochovski, H.G. Börner
Advancing Drug Formulation Additives toward Precision Additives with Release Mediating Peptide Interlayer
[article] Journal of the American Chemical Society 138 30 9349-9352 DOI:10.1021/jacs.6b03604

W. Zhang, Z. Kochovski, Y. Lu, B.V.K.J. Schmidt, M. Antonietti, J. Yuan
Internal Morphology-Controllable Self-Assembly in Poly(Ionic Liquid) Nanoparticles
[article] ACS Nano 10 8 7731-7737 DOI:10.1021/acsnano.6b03135

V. Can, Z. Kochovski, V. Reiter, N. Severin, M. Siebenbürger, B. Kent, J. Just, J.P. Rabe, M. Ballauff, O. Okay
Nanostructural Evolution and Self-Healing Mechanism of Micellar Hydrogels
[article] Macromolecules 49 6 2281-2287 DOI:10.1021/acs.macromol.6b00156

W. Zhang, Z. Kochovski, B.V.K.J. Schmidt, M. Antonietti, J. Yuan
Crosslinked 1,2,4-triazolium-type poly(ionic liquid) nanoparticles
[article] Polymer DOI:10.1016/j.polymer.2016.09.045

F. Wang, R.S. Pennington, C.T. Koch
Inversion of Dynamical Scattering from Large-Angle Rocking-Beam Electron Diffraction Patterns
[article] Physical Review Letters 117 1 DOI:10.1103/PhysRevLett.117.015501

N. Talebi, C. Ozsoy-Keskinbora, H.M. Benia, K. Kern, C.T. Koch, P.A. van Aken
Wedge Dyakonov Waves and Dyakonov Plasmons in Topological Insulator Bi2Se3 Probed by Electron Beams
[article] ACS Nano 10 7 6988-6994 DOI:10.1021/acsnano.6b02968

J.M. Mánuel, C.T. Koch, V.B. Özdöl, W. Sigle, P.A. Van Aken, R. García, F.M. Morales
Inline electron holography and VEELS for the measurement of strain in ternary and quaternary (In,Al,Ga)N alloyed thin films and its effect on bandgap energy
[article] Journal of Microscopy 261 1 27-35 DOI:10.1111/jmi.12312

H. Jia, R. Roa, S. Angioletti-Uberti, K. Henzler, A. Ott, X. Lin, J. Möser, Z. Kochovski, A. Schnegg, J. Dzubiella, M. Ballauff, Y. Lu
Thermosensitive Cu2O–PNIPAM core–shell nanoreactors with tunable photocatalytic activity
[article] J. Mater. Chem. A 4 24 9677-9684 DOI:10.1039/C6TA03528K

A. Parvizi, W. Van den Broek, C.T. Koch
Gradient flipping algorithm: introducing non-convex constraints in wavefront reconstructions with the transport of intensity equation
[article] Optics Express 24 8 8344 DOI:10.1364/OE.24.008344

X. Jiang, W. Van den Broek, C.T. Koch
Inverse dynamical photon scattering (IDPS): an artificial neural network based algorithm for three-dimensional quantitative imaging in optical microscopy
[article] Optics Express 24 7 7006 DOI:10.1364/OE.24.007006

A. Mogilatenko, A. Knauer, U. Zeimer, M. Weyers
Defect distribution and compositional inhomogeneities in Al0.5Ga0.5N layers grown on stepped surfaces
[article] Semiconductor Science and Technology 31 2 025007 DOI:10.1088/0268-1242/31/2/025007

R.S. Pennington, C.T. Koch
3D characterization using transmission electron diffraction, neural network optimization, and density functional theory
[conference proceedings] Proceedings of the European Microscopy Congress 2016 in Lyon, France

A. Parvizi, W. Van den Broek, K. Blessing, C.T. Koch
Wave front reconstruction vi the transport of intensity equation: Introduction of non-convex constraints
[conference proceedings] Proceedings of the European Microscopy Congress 2016 in Lyon, France

J. Müller, K. Blessing, C. Koch
Optical quantitative phase imaging by focal series reconstruction with partially coherent illumination
[conference proceedings] Proceedings of the European Microscopy Congress 2016 in Lyon, France

W. Van den Broek, X. Jiang, C.T. Koch
An artificial neural network based algorithm for three-dimensional quantitative imaging in optical microscopy
[conference proceedings] Proceedings of the European Microscopy Congress 2016 in Lyon, France

W. Van den Broek, C. Koch
Superresolution and depth sensitivity in HRTEM through structured illumination
[conference proceedings] Proceedings of the European Microscopy Congress 2016 in Lyon, France

F. Wang, R. Pennington, C. Koch
Inversion of dynamical scattering from large-angle rocking-beam electron diffraction patterns
[conference proceedings] Proceedings of the European Microscopy Congress 2016 in Lyon, France

C.T. Koch, W. Van den Broek, F. Wang, R. Pennington
Retrieving atomic structure from dynamical rocking curve measurements in both real and reciprocal space
[conference proceedings] Proceedings of the European Microscopy Congress 2016 in Lyon, France

H. Kirmse, M. Sparenberg, S. Sadofev, S. Blumstengel, C.T. Koch
Visualization of ordering phenomena in di-fluorinated sexiphenyl by HRTEM
[conference proceedings] Proceedings of the European Microscopy Congress 2016 in Lyon, France

O. Chiatti, C. Riha, D. Lawrenz, M. Busch, S. Dusari, J. Sánchez-Barriga, A. Mogilatenko, L.V. Yashina, S. Valencia, A.A. Ünal, O. Rader, S.F. Fischer
2D layered transport properties from topological insulator Bi2Se3 single crystals and micro flakes
[article] Scientific Reports 6 27483 DOI:10.1038/srep27483

C. Grosse, M.B. Alemayehu, M. Falmbigl, A. Mogilatenko, O. Chiatti, D.C. Johnson, S.F. Fischer
Superconducting ferecrystals: turbostratically disordered atomic-scale layered (PbSe)1.14(NbSe2)n thin films
[article] Scientific Reports 6 33457 DOI:10.1038/srep33457

S. Hagedorn, A. Knauer, A. Mogilatenko, E. Richter, M. Weyers
AlN growth on nano-patterned sapphire: A route for cost efficient pseudo substrates for deep UV LEDs: AlN growth on nano-patterned sapphire
[article] physica status solidi (a) DOI:10.1002/pssa.201600218

A. Knauer, A. Mogilatenko, S. Hagedorn, J. Enslin, T. Wernicke, M. Kneissl, M. Weyers
Correlation of sapphire off-cut and reduction of defect density in MOVPE grown AlN: Sapphire off-cut and defect density in MOVPE grown AlN
[article] physica status solidi (b) 253 5 809-813 DOI:10.1002/pssb.201600075

A. De Backer, K.H.W. van den Bos, W. Van den Broek, J. Sijbers, S. Van Aert
StatSTEM : An efficient approach for accurate and precise model-based quantification of atomic resolution electron microscopy images
[article] Ultramicroscopy 171 104-116 DOI:10.1016/j.ultramic.2016.08.018

S. Käbisch, M. Timpel, H. Kirmse, M.A. Gluba, N. Koch, N.H. Nickel
Polarity of pulsed laser deposited ZnO nanostructures
[article] Applied Physics Letters 108 8 083114 DOI:10.1063/1.4942887

E. Steeg, F. Polzer, H. Kirmse, Y. Qiao, J.P. Rabe, S. Kirstein
Nucleation, growth, and dissolution of silver nanostructures formed in nanotubular J-aggregates of amphiphilic cyanine dyes
[article] Journal of Colloid and Interface Science 472 187-194 DOI:10.1016/j.jcis.2016.03.022

H. Kirmse, M. Sparenberg, A. Zykov, S. Sadofev, S. Kowarik, S. Blumstengel
Structure of p-Sexiphenyl Nanocrystallites in ZnO Revealed by High-Resolution Transmission Electron Microscopy
[article] Crystal Growth & Design 16 5 2789-2794 DOI:10.1021/acs.cgd.6b00109

M. Roslova, L. Opherden, I. Veremchuk, L. Spillecke, H. Kirmse, T. Herrmannsdörfer, J. Wosnitza, T. Doert, M. Ruck
Downscaling Effect on the Superconductivity of Pd3Bi2X2 (X = S or Se) Nanoparticles Prepared by Microwave-Assisted Polyol Synthesis
[article] Inorganic Chemistry 55 17 8808-8815 DOI:10.1021/acs.inorgchem.6b01326

C. Ozsoy-Keskinbora, N. Talebi, H.M. Benia, C.T. Koch, P.A. van Aken
Hyperbolic Plasmons in the Topological Insulator Bi2Se3
[conference proceedings] Proceedings of the 16th European Microscopy Congress in Lyon

D. Kojda, R. Mitdank, S. Weidemann, A. Mogilatenko, Z. Wang, J. Ruhhammer, M. Kroener, W. Töllner, P. Woias, K. Nielsch, S.F. Fischer
Surface effects on thermoelectric properties of metallic and semiconducting nanowires: Surface effects in thermoelectric nanowires
[article] physica status solidi (a) 213 3 557-570 DOI:10.1002/pssa.201532464

G. Yang, X. Zhang, Z. Kochovski, Y. Zhang, B. Dai, F. Sakai, L. Jiang, Y. Lu, M. Ballauff, X. Li, C. Liu, G. Chen, M. Jiang
Precise and Reversible Protein-Microtubule-Like Structure with Helicity Driven by Dual Supramolecular Interactions
[article] Journal of the American Chemical Society 138 6 1932-1937 DOI:10.1021/jacs.5b11733

C. Cocchi, H. Zschiesche, D. Nabok, A. Mogilatenko, M. Albrecht, Z. Galazka, H. Kirmse, C. Draxl, C.T. Koch
Atomic signatures of local environment from core-level spectroscopy in β - Ga 2 O 3
[article] Physical Review B 94 7 DOI:10.1103/PhysRevB.94.075147

C. Ozsoy-Keskinbora, C.B. Boothroyd, R.E. Dunin-Borkowski, P.A. van Aken, C.T. Koch
Mapping the electrostatic potential of Au nanoparticles using hybrid electron holography
[article] Ultramicroscopy 165 8-14 DOI:10.1016/j.ultramic.2016.03.007

2015

W. Van den Broek, X. Jiang, C.T. Koch
Retrieving low frequencies in exit-wave reconstructions from focal series through total-variation-like regularization of the error function
[conference proceedings] Proceedings of the Microscopy Conference 2015 in Göttingen

N. Talebi, C. Özsoy-Keskinbora, H.M. Benia, C.T. Koch, P.A. van Aken
Plasmons in topological insulator Bi2Se3 unravelled by swift electrons
[conference proceedings] Proceedings of the Microscopy Conference 2015 in Göttingen

R.S. Pennington, C.T. Koch
Retrieving depth-direction specimen variations in ferroelectric polarization and strain from TEM diffraction data using artificial neural network optimization
[conference proceedings] Proceedings of the Microscopy Conference 2015 in Göttingen

A. Parvizi, C.T. Koch, J. Müller
A gradient flipping regularized solution to the transport of intensity equation(GFTIE)
[conference proceedings] Proceedings of the Microscopy Conference 2015 in Göttingen

D. Tyutyunnikov, M. Mitsuhara, C.T. Koch
Two-dimensional misorientation mapping by rocking dark-field transmission electron microscopy
[conference proceedings] Proceedings of the Microscopy Conference 2015 in Göttingen

F. Wang, R. Pennington, C.T. Koch
Refinement of crystal structure from LABED patterns
[conference proceedings] Proceedings of the Microscopy Conference 2015 in Göttingen

C. Ozsoy-Keskinbora, N. Talebi, H.M. Benia, C.T. Koch, P.A. van Aken
Unconventional Surface Plasmon Excitations in Bi2Se3
[conference proceedings] Proceedings of the Microscopy & Microanalysis 2015 DOI:10.1017/S143192761501106X

X. Jiang, W. Van den Broek, J. Müller, C.T. Koch
Illumination convergence semi-angle estimation using the inverse dynamical photon scattering framework
[conference proceedings] Proceedings of the Microscopy Conference 2015 in Göttingen

H. Kirmse, E. Steeg, S. Kirstein, J.P. Rabe
Precession-based variable conical dark field-imaging for solving materials science problems
[conference proceedings] Proceedings of the Microscopy Conference 2015 in Göttingen

H. Zschiesche, A. Mogilatenko, H. Kirmse
Optimization of energy resolution for EELS measurements in diffraction mode
[conference proceedings] Proceedings of the Microscopy Conference 2015 in Göttingen

C. Ozsoy-Keskinbora, C.B. Boothroyd, R.E. Dunin-Borkowski, P.A. van Aken, C.T. Koch
Hybrid Electron Holography
[conference proceedings] Proceedings of the Microscopy & Microanalysis 2015 DOI:10.1017/S1431927615012337

B. Jenichen, U. Jahn, A. Nikulin, J. Herfort, H. Kirmse
Structure of Fe3Si/Al/Fe3Si thin film stacks on GaAs(001)
[article] Semiconductor Science and Technology 30 11 114005 DOI:10.1088/0268-1242/30/11/114005

G. Autès, A. Isaeva, L. Moreschini, J.C. Johannsen, A. Pisoni, R. Mori, W. Zhang, T.G. Filatova, A.N. Kuznetsov, L. Forró, W. Van den Broek, Y. Kim, K.S. Kim, A. Lanzara, J.D. Denlinger, E. Rotenberg, A. Bostwick, M. Grioni, O.V. Yazyev
A novel quasi-one-dimensional topological insulator in bismuth iodide β-Bi4I4
[article] Nature Materials 15 2 154-158 DOI:10.1038/nmat4488

C. Ozsoy-Keskinbora, W. Van den Broek, A. Parvizi, X. Jiang, C.B. Boothroyd, R.E. Dunin-Borkowski, P.A. van Aken, C.T. Koch
Full-resolution high-contrast imaging of phase objects by gradient-flipping-assisted focal series reconstruction
[conference proceedings] Proceedings of the Microscopy Conference 2015 in Göttingen

S. Sadofev, S. Kalusniak, P. Schäfer, H. Kirmse, F. Henneberger
Free-electron concentration and polarity inversion domains in plasmonic (Zn,Ga)O: Polarity inversion domains in plasmonic (Zn,Ga)O
[article] physica status solidi (b) 252 3 607-611 DOI:10.1002/pssb.201451533

K. Song, C.T. Koch, J.K. Lee, D.Y. Kim, J.K. Kim, A. Parvizi, W.Y. Jung, C.G. Park, H.J. Jeong, H.S. Kim, Y. Cao, T. Yang, L. Chen, S.H. Oh
Correlative High-Resolution Mapping of Strain and Charge Density in a Strained Piezoelectric Multilayer
[article] Advanced Materials Interfaces 2 1 1400281 DOI:10.1002/admi.201400281

R.S. Pennington, C.T. Koch
Retrieving depth-direction information from TEM diffraction data under reciprocal-space sampling variation
[article] Ultramicroscopy 148 105-114 DOI:10.1016/j.ultramic.2014.10.006

V. Hoffmann, A. Mogilatenko, U. Zeimer, S. Einfeldt, M. Weyers, M. Kneissl
In-situ observation of InGaN quantum well decomposition during growth of laser diodes
[article] Crystal Research and Technology 50 6 499-503 DOI:10.1002/crat.201500073

A. Parvizi, J. Müller, S.A. Funken, C.T. Koch
A practical way to resolve ambiguities in wavefront reconstructions by the transport of intensity equation
[article] Ultramicroscopy 154 1-6 DOI:10.1016/j.ultramic.2015.02.015

D. Tyutyunnikov, M. Mitsuhara, C.T. Koch
Two-dimensional misorientation mapping by rocking dark-field transmission electron microscopy
[article] Ultramicroscopy 159 26-33 DOI:10.1016/j.ultramic.2015.07.003

S. Fleischmann, A. Mogilatenko, S. Hagedorn, E. Richter, D. Goran, P. Schäfer, U. Zeimer, M. Weyers, G. Tränkle
Analysis of HVPE grown AlGaN layers on honeycomb patterned sapphire
[article] Journal of Crystal Growth 414 32-37 DOI:10.1016/j.jcrysgro.2014.10.010

S. Weidemann, M. Kockert, D. Wallacher, M. Ramsteiner, A. Mogilatenko, K. Rademann, S.F. Fischer
Controlled Pore Formation on Mesoporous Single Crystalline Silicon Nanowires: Threshold and Mechanisms
[article] Journal of Nanomaterials 2015 1-11 DOI:10.1155/2015/672305

A. Mogilatenko, J. Enslin, A. Knauer, F. Mehnke, K. Bellmann, T. Wernicke, M. Weyers, M. Kneissl
V-pit to truncated pyramid transition in AlGaN-based heterostructures
[article] Semiconductor Science and Technology 30 11 114010 DOI:10.1088/0268-1242/30/11/114010

Y. Qiao, F. Polzer, H. Kirmse, E. Steeg, S. Kühn, S. Friede, S. Kirstein, J.P. Rabe
Nanotubular J-Aggregates and Quantum Dots Coupled for Efficient Resonance Excitation Energy Transfer
[article] ACS Nano 9 2 1552-1560 DOI:10.1021/nn506095g

Y. Yang, M. Ambrogi, H. Kirmse, Y. Men, M. Antonietti, J. Yuan
Poly(ionic liquid) Core Turns Hollow Silica Spheres into Amphiphilic Nanoreactor in Water
[article] Chemistry of Materials 27 1 127-132 DOI:10.1021/cm5035535

U. Zeimer, J. Jeschke, A. Mogilatenko, A. Knauer, V. Kueller, V. Hoffmann, C. Kuhn, T. Simoneit, M. Martens, T. Wernicke, M. Kneissl, M. Weyers
Spatial inhomogeneities in AlxGa1-xN quantum wells induced by the surface morphology of AlN/sapphire templates
[article] Semiconductor Science and Technology 30 11 114008 DOI:10.1088/0268-1242/30/11/114008

C. Zheng, H. Kirmse, J. Long, D.E. Laughlin, M.E. McHenry, W. Neumann
Investigation of (Fe,Co)NbB-Based Nanocrystalline Soft Magnetic Alloys by Lorentz Microscopy and Off-Axis Electron Holography
[article] Microscopy and Microanalysis 21 02 498-509 DOI:10.1017/S1431927614013592

Y. Qiao, F. Polzer, H. Kirmse, S. Kirstein, J.P. Rabe
Nanohybrids from nanotubular J-aggregates and transparent silica nanoshells
[article] Chem. Commun. 51 60 11980-11982 DOI:10.1039/C5CC00901D

J. Woo, A. Borisevich, C.T. Koch, V.V. Guliants
Quantitative Analysis of HAADF-STEM Images of MoVTeTaO M1 Phase Catalyst for Propane Ammoxidation to Acrylonitrile
[article] ChemCatChem 7 22 3731-3737 DOI:10.1002/cctc.201500402

R.S. Pennington, C.T. Koch
A three-dimensional polarization domain retrieval method from electron diffraction data
[article] Ultramicroscopy 155 42-48 DOI:10.1016/j.ultramic.2015.04.002

R.S. Pennington, C.B. Boothroyd, R.E. Dunin-Borkowski
Surface effects on mean inner potentials studied using density functional theory
[article] Ultramicroscopy 159 34-45 DOI:10.1016/j.ultramic.2015.07.011

D. Kojda, R. Mitdank, M. Handwerg, A. Mogilatenko, M. Albrecht, Z. Wang, J. Ruhhammer, M. Kroener, P. Woias, S.F. Fischer
Temperature-dependent thermoelectric properties of individual silver nanowires
[article] Physical Review B 91 2 DOI:10.1103/PhysRevB.91.024302

D. Tyutyunnikov, V. Burak Özdöl, C.T. Koch
Simultaneous orientation and thickness mapping in transmission electron microscopy
[article] Ultramicroscopy 150 37-43 DOI:10.1016/j.ultramic.2014.11.034

J. Rass, T. Kolbe, N. Lobo-Ploch, T. Wernicke, F. Mehnke, C. Kuhn, J. Enslin, M. Guttmann, C. Reich, A. Mogilatenko, J. Glaab, C. Stoelmacker, M. Lapeyrade, S. Einfeldt, M. Weyers, M. Kneissl
High-power UV-B LEDs with long lifetime
[conference proceedings] DOI:10.1117/12.2077426

W. Van den Broek, X. Jiang, C.T. Koch
FDES, a GPU-based multislice algorithm with increased efficiency of the computation of the projected potential
[article] Ultramicroscopy 158 89-97 DOI:10.1016/j.ultramic.2015.07.005

W. Van den Broek, C.T. Koch
Real-Space Simulation of Electron Scattering in Imperfect Crystals and Reconstruction of the Electrostatic Potential
[conference proceedings] Microscopy and Microanalysis 21 S3 1883-1884 DOI:10.1017/S1431927615010193

2014

S.S. Schmidt, J. Dietrich, C.T. Koch, B. Schaffer, M. Schaffer, M. Klingsporn, S. Merdes, D. Abou-Ras
Interfaces and Extended Structural Defects in Chalcopyrite Thin-Film Solar Cells Studied by Transmission Electron Microscopy
[conference proceedings] Microscopy and Microanalysis 20 S3 530-531 DOI:10.1017/S1431927614004371

C. Ozsoy-Keskinbora, C.B. Boothroyd, R.E. Dunin-Borkowski, P.A. van Aken, C.T. Koch
Hybridization of Off-Axis and In-line High-Resolution Electron Holography
[conference proceedings] Microscopy and Microanalysis 20 S3 272-273 DOI:10.1017/S1431927614003080

A. Mogilatenko
Epitaxial Growth of GaN on LiAlO2 Substrates
[book chapter] Introduction to Crystal Growth and Characterization - Wiley-VCH

J. Dietrich, D. Abou-Ras, S.S. Schmidt, T. Rissom, T. Unold, O. Cojocaru-Mirédin, T. Niermann, M. Lehmann, C.T. Koch, C. Boit
Origins of electrostatic potential wells at dislocations in polycrystalline Cu(In,Ga)Se2 thin films
[article] Journal of Applied Physics 115 10 103507 DOI:10.1063/1.4867398

V.B. Özdöl, D. Tyutyunnikov, C.T. Koch, P.A. van Aken
Strain mapping for advanced CMOS technologies: Strain mapping for advanced CMOS technologies
[article] Crystal Research and Technology 49 1 38-42 DOI:10.1002/crat.201300226

W. Van den Broek, A. Rosenauer, S. Van Aert, J. Sijbers, D. Van Dyck
A memory efficient method for fully three-dimensional object reconstruction with HAADF STEM
[article] Ultramicroscopy 141 22-31 DOI:10.1016/j.ultramic.2014.03.008

R.S. Pennington, W. Van den Broek, C.T. Koch
Third-dimension information retrieval from a single convergent-beam transmission electron diffraction pattern using an artificial neural network
[article] Physical Review B 89 20 DOI:10.1103/PhysRevB.89.205409

C.T. Koch, W. Van den Broek
Measuring three-dimensional positions of atoms to the highest accuracy with electrons
[article] Comptes Rendus Physique 15 2-3 119-125 DOI:10.1016/j.crhy.2013.10.004

R.S. Pennington, F. Wang, C.T. Koch
Stacked-Bloch-wave electron diffraction simulations using GPU acceleration
[article] Ultramicroscopy 141 32-37 DOI:10.1016/j.ultramic.2014.03.003

C. Ozsoy-Keskinbora, C.B. Boothroyd, R.E. Dunin-Borkowski, P.A. van Aken, C.T. Koch
Hybridization approach to in-line and off-axis (electron) holography for superior resolution and phase sensitivity
[article] Scientific Reports 4 7020 DOI:10.1038/srep07020

V. Hoffmann, A. Mogilatenko, C. Netzel, U. Zeimer, S. Einfeldt, M. Weyers, M. Kneissl
Influence of barrier growth schemes on the structural properties and thresholds of InGaN quantum well laser diodes
[article] Journal of Crystal Growth 391 46-51 DOI:10.1016/j.jcrysgro.2013.12.046

C.T. Koch
Towards full-resolution inline electron holography
[article] Micron 63 69-75 DOI:10.1016/j.micron.2013.10.009

O. Brox, F. Bugge, A. Mogilatenko, E. Luvsandamdin, A. Wicht, H. Wenzel, G. Erbert
Distributed feedback lasers in the 760 to 810 nm range and epitaxial grating design
[article] Semiconductor Science and Technology 29 9 095018 DOI:10.1088/0268-1242/29/9/095018

S. Blumstengel, H. Kirmse, M. Sparenberg, S. Sadofev, F. Polzer, F. Henneberger
Texture and morphology of ZnO grown on nanocrystalline p-sexiphenyl thin films
[article] Journal of Crystal Growth 402 187-194 DOI:10.1016/j.jcrysgro.2014.05.009

A. Mogilatenko, H. Kirmse, O. Bierwagen, M. Schmidbauer, M. Tsai, I. Häusler, M.E. White, J.S. Speck
Effect of heavy Ga doping on defect structure of SnO2 layers: Effect of heavy Ga doping on defect structure of SnO2 layers
[article] physica status solidi (a) 211 1 87-92 DOI:10.1002/pssa.201330145

D. Kojda, R. Mitdank, A. Mogilatenko, W. Töllner, Z. Wang, M. Kröner, P. Woias, K. Nielsch, S.F. Fischer
The effect of a distinct diameter variation on the thermoelectric properties of individual Bi0.39Te0.61 nanowires
[article] Semiconductor Science and Technology 29 12 124006 DOI:10.1088/0268-1242/29/12/124006

O. Brox, F. Bugge, A. Mogilatenko, E. Luvsandamdin, A. Wicht, H. Wenzel, G. Erbert
Small linewidths 76× nm DFB-laser diodes with optimised two-step epitaxial gratings
[conference proceedings] DOI:10.1117/12.2052914

P. Ivo, E.M. Cho, P. Kotara, L. Schellhase, R. Lossy, U. Zeimer, A. Mogilatenko, J. Würfl, G. Tränkle, A. Glowacki, C. Boit
New degradation mechanism observed for AlGaN/GaN HEMTs with sub 100nm scale unpassivated regions around the gate periphery
[article] Microelectronics Reliability 54 6-7 1288-1292 DOI:10.1016/j.microrel.2014.03.005

A. Mogilatenko, V. Küller, A. Knauer, J. Jeschke, U. Zeimer, M. Weyers, G. Tränkle
Defect analysis in AlGaN layers on AlN templates obtained by epitaxial lateral overgrowth
[article] Journal of Crystal Growth 402 222-229 DOI:10.1016/j.jcrysgro.2014.06.025

A. Mogilatenko, H. Kirmse, J. Stellmach, M. Frentrup, F. Mehnke, T. Wernicke, M. Kneissl, M. Weyers
Analysis of crystal orientation in AlN layers grown on m-plane sapphire
[article] Journal of Crystal Growth 400 54-60 DOI:10.1016/j.jcrysgro.2014.04.014

L. Schmidt, F. Emmerling, H. Kirmse, E. Kemnitz
Sol–gel synthesis and characterisation of nanoscopic strontium fluoride
[article] RSC Adv. 4 1 32-38 DOI:10.1039/C3RA43769H

E. Richter, S. Fleischmann, D. Goran, S. Hagedorn, W. John, A. Mogilatenko, D. Prasai, U. Zeimer, M. Weyers, G. Tränkle
Hydride Vapor-Phase Epitaxy of c-Plane AlGaN Layers on Patterned Sapphire Substrates
[article] Journal of Electronic Materials 43 4 814-818 DOI:10.1007/s11664-013-2871-x

Y. Qiao, F. Polzer, H. Kirmse, E. Steeg, S. Kirstein, J.P. Rabe
In situ synthesis of semiconductor nanocrystals at the surface of tubular J-aggregates
[article] J. Mater. Chem. C 2 43 9141-9148 DOI:10.1039/C4TC01724B

2013

W. Van den Broek, C.T. Koch
Towards an experimental realization of inverse dynamical electron scattering
[conference proceedings] Proceedings of the Microscopy Conference MC2013

W. Sigle
Peak mapping in EFTEM
[conference proceedings] Proceedings of the Microscopy Conference MC2013

C. Özsoy-Keskinbora
Electrostatic potential mapping in topological insulators by inline electron holography
[conference proceedings] Proceedings of the Microscopy Conference MC2013

B. Ögüt
Hybridized metal slit eigenmodes as an illustration of Babinet's principle
[conference proceedings] Proceedings of the Microscopy Conference MC2013

C.T. Koch
Non-linear electron tomography
[conference proceedings] Proceedings of the Microscopy Conference MC2013

A. Tejada, W. Van den Broek, A.J. den Dekker
Measure-by-Wire (MBW): An Automatic Control Framework for High-Throughput Transmission Electron Microscopy
[book chapter] Advances in Imaging and Electron Physics - Elsevier

D. Tyutyunnikov, C.T. Koch, P.A. van Aken
Resolution Extension in Missing-wedge-free Dark-field Tomography
[conference proceedings] Proceedings of the Microscopy Conference MC2013

C.T. Koch, W. Van den Broek
Non – linear electron tomography
[conference proceedings] Proceedings of the Microscopy Conference MC2013

R. Jansen, C.T. Koch, G. Schoenhense, A. Parvizi
Monochromatizing without filtering using dynamic fields without bunching: A new concept for d-TEM illumination
[conference proceedings] Proceedings of the Microscopy Conference MC2013

F. Wang, R.S. Pennington, C.T. Koch
GPU – accelerated Bloch wave calculation for quantitative structure factor determination
[conference proceedings] Proceedings of the Microscopy Conference MC2013

R.S. Pennington, C.T. Koch
A modified Bloch – wave approach for dynamical scattering to limited order for structurally complex specimens
[conference proceedings] Proceedings of the Microscopy Conference MC2013

C.T. Koch, F. Wang
Towards automated solving of the dynamic Inversion problem in electron diffraction for moderately thick crystals
[conference proceedings] Proceedings of the Microscopy Conference MC2013

A. Maasdorf, C.M. Schultz, O. Brox, H. Wenzel, P. Crump, F. Bugge, A. Mogilatenko, G. Erbert, M. Weyers, G. Tränkle
In-situ etching of patterned GaAs/InGaP surfaces for highly efficient 975nm DFB-BA diode lasers
[article] Journal of Crystal Growth 370 226-229 DOI:10.1016/j.jcrysgro.2012.08.012

A. Mogilatenko, S. Hagedorn, E. Richter, U. Zeimer, D. Goran, M. Weyers, G. Tränkle
Predominant growth of non-polar a-plane (Al,Ga)N on patterned c-plane sapphire by hydride vapor phase epitaxy
[article] Journal of Applied Physics 113 9 093505 DOI:10.1063/1.4794098

C.T. Koch
The World of Nano
[article] PanEuropean Networks, Science and Technology 9 68-69

C.T. Koch, W. Van den Broek
An eye for detail
[article] International Innovations 77-79

E. Cho, A. Mogilatenko, F. Brunner, E. Richter, M. Weyers
Impact of AlN nucleation layer on strain in GaN grown on 4H-SiC substrates
[article] Journal of Crystal Growth 371 45-49 DOI:10.1016/j.jcrysgro.2013.02.001

M. Soumelidou, J. Kioseoglou, H. Kirmse, P. Komninou, T. Karakostas
Structural and electronic properties of InGaN/GaN nanowires by the use of EELS
[article] physica status solidi (c) 10 1 105-108 DOI:10.1002/pssc.201200550

C.L. Zheng, K. Scheerschmidt, H. Kirmse, I. Häusler, W. Neumann
Imaging of three-dimensional (Si,Ge) nanostructures by off-axis electron holography
[article] Ultramicroscopy 124 108-116 DOI:10.1016/j.ultramic.2012.09.004

J. Balach, H. Wu, F. Polzer, H. Kirmse, Q. Zhao, Z. Wei, J. Yuan
Poly(ionic liquid)-derived nitrogen-doped hollow carbon spheres: synthesis and loading with Fe2O3 for high-performance lithium ion batteries
[article] RSC Advances 3 21 7979 DOI:10.1039/c3ra41229f

R.E. Sah, L. Kirste, H. Kirmse, M. Mildner, L. Wilde, S. Kopta, F. Knobber, M. Krieg, V. Cimalla, V. Lebedev, O. Ambacher
Crystallographic Texture of Submicron Thin Aluminum Nitride Films on Molybdenum Electrode for Suspended Micro and Nanosystems
[article] ECS Journal of Solid State Science and Technology 2 4 P180-P184 DOI:10.1149/2.001305jss

A. Mogilatenko, H. Kirmse, S. Hagedorn, E. Richter, U. Zeimer, M. Weyers, G.T. ränkle
Origin of a-plane (Al,Ga)N formation on patterned c-plane AIN/sapphire templates
[article] Journal of Physics: Conference Series 471 012038 DOI:10.1088/1742-6596/471/1/012038

H. Kirmse, E. Oehlschlegel, F. Polzer, S. Blumstengel, M. Sparenberg, F. Henneberger
Cross-sectional TEM preparation of hybrid inorganic/organic materials systems by ultramicrotomy
[article] Journal of Physics: Conference Series 471 012034 DOI:10.1088/1742-6596/471/1/012034

M.M. Soumelidou, J. Kioseoglou, H. Kirmse, T. Karakostas, P. Komninou
Electron energy loss near edge structure of InxAl1-xN alloys
[article] Microelectronic Engineering 112 198-203 DOI:10.1016/j.mee.2013.04.006

F. Polzer, E. Holub-Krappe, H. Rossner, A. Erko, H. Kirmse, F. Plamper, A. Schmalz, A.H.E. Müller, M. Ballauff
Structural analysis of colloidal MnO x composites
[article] Colloid and Polymer Science 291 3 469-481 DOI:10.1007/s00396-012-2725-8

H. Heidari, W. Van den Broek, S. Bals
Quantitative electron tomography: The effect of the three-dimensional point spread function
[article] Ultramicroscopy 135 1-5 DOI:10.1016/j.ultramic.2013.06.005

B. Rasche, A. Isaeva, A. Gerisch, M. Kaiser, W. Van den Broek, C.T. Koch, U. Kaiser, M. Ruck
Crystal Growth and Real Structure Effects of the First Weak 3D Stacked Topological Insulator Bi14Rh3I9
[article] Chemistry of Materials 25 11 2359-2364 DOI:10.1021/cm4010823

C. Grosse, R. Atkins, H. Kirmse, A. Mogilatenko, W. Neumann, D.C. Johnson
Local structure and defect chemistry of [(SnSe)1.15]m(TaSe2) ferecrystals – A new type of layered intergrowth compound
[article] Journal of Alloys and Compounds 579 507-515 DOI:10.1016/j.jallcom.2013.06.074

M. Elagin, P. Schulz, M. Elagin, M.P. Semtsiv, H. Kirmse, A. Mogilatenko, W.T. Masselink
Highly strained photovoltaic dual-channel intersubband photodetectors grown by gas-source MBE
[article] Journal of Crystal Growth 378 607-610 DOI:10.1016/j.jcrysgro.2012.12.123

K. Song, G. Shin, J.K. Kim, S.H. Oh, C.T. Koch
Strain mapping of LED devices by dark-field inline electron holography: Comparison between deterministic and iterative phase retrieval approaches
[article] Ultramicroscopy 127 119-125 DOI:10.1016/j.ultramic.2012.07.010

W. Van den Broek, C.T. Koch
General framework for quantitative three-dimensional reconstruction from arbitrary detection geometries in TEM
[article] Physical Review B 87 18 DOI:10.1103/PhysRevB.87.184108

X. Mu, S. Neelamraju, W. Sigle, C.T. Koch, N. Totò, J.C. Schön, A. Bach, D. Fischer, M. Jansen, P.A. van Aken
Evolution of order in amorphous-to-crystalline phase transformation of MgF2
[article] Journal of Applied Crystallography 46 4 1105-1116 DOI:10.1107/S0021889813011345

V. Srot, U.G.K. Wegst, U. Salzberger, C.T. Koch, K. Hahn, P. Kopold, P.A. van Aken
Microstructure, chemistry, and electronic structure of natural hybrid composites in abalone shell
[article] Micron 48 54-64 DOI:10.1016/j.micron.2013.02.010

A. Alpers, R.J. Gardner, S. König, R.S. Pennington, C.B. Boothroyd, L. Houben, R.E. Dunin-Borkowski, K. Joost Batenburg
Geometric reconstruction methods for electron tomography
[article] Ultramicroscopy 128 42-54 DOI:10.1016/j.ultramic.2013.01.002

M. Gandman, Y. Kauffmann, C.T. Koch, W.D. Kaplan
Direct Quantification of Ordering at a Solid-Liquid Interface Using Aberration Corrected Transmission Electron Microscopy
[article] Physical Review Letters 110 8 DOI:10.1103/PhysRevLett.110.086106

M. Lapeyrade, A. Muhin, S. Einfeldt, U. Zeimer, A. Mogilatenko, M. Weyers, M. Kneissl
Electrical properties and microstructure of vanadium-based contacts on ICP plasma etched n-type AlGaN:Si and GaN:Si surfaces
[article] Semiconductor Science and Technology 28 12 125015 DOI:10.1088/0268-1242/28/12/125015

F. Brunner, A. Mogilatenko, V. Kueller, A. Knauer, M. Weyers
Stress evolution during AlxGa1-xN/AlN growth on sapphire
[article] Journal of Crystal Growth 376 54-58 DOI:10.1016/j.jcrysgro.2013.04.023

U. Zeimer, A. Mogilatenko, V. Kueller, A. Knauer, M. Weyers
Cathodoluminescence and TEM investigations of structural and optical properties of AlGaN on epitaxial laterally overgrown AlN/sapphire templates
[article] Journal of Physics: Conference Series 471 012021 DOI:10.1088/1742-6596/471/1/012021

U. Zeimer, V. Kueller, A. Knauer, A. Mogilatenko, M. Weyers, M. Kneissl
High quality AlGaN grown on ELO AlN/sapphire templates
[article] Journal of Crystal Growth 377 32-36 DOI:10.1016/j.jcrysgro.2013.04.041

C. Ophus, J. Ciston, P. Ercius, C. Koch
Quantitative Reconstruction and Analysis of HRTEM Complex Exit Waves using Inline Holography
[conference proceedings] Microscopy and Microanalysis 19 S2 322-323 DOI:10.1017/S1431927613003607

V.B. Ozdol, C.T. Koch, A.M. Minor
Nanometer-scale Characterization Tools for Strain-Engineered Semiconductor Devices
[conference proceedings] Microscopy and Microanalysis 19 S2 1076-1077 DOI:10.1017/S143192761300737X

K. Song, C.T. Koch, S.-. Choi, H.N. Lee, S. Ryu, C.-. Eom, S.H. Oh
Mapping of Two Dimensional Electron Gas at Atomically Abrupt Oxide Interfaces using Inline Electron Holography
[conference proceedings] Microscopy and Microanalysis 19 S2 1364-1365 DOI:10.1017/S1431927613008817

2012

V. Srot, B. Bussmann, U. Salzberger, C.T. Koch, P.A. van Aken
Linking Microstructure and Nanochemistry in Human Dental Tissues
[article] Microscopy and Microanalysis 18 3 509-523 DOI:10.1017/S1431927612000116

S. Van Aert, W. Van den Broek, P. Goos, D. Van Dyck
Model-based electron microscopy: From images toward precise numbers for unknown structure parameters
[article] Micron 43 4 509-515 DOI:10.1016/j.micron.2011.10.019

W. Van den Broek, S. Van Aert, D. Van Dyck
Fully Automated Measurement of the Modulation Transfer Function of Charge-Coupled Devices above the Nyquist Frequency
[article] Microscopy and Microanalysis 18 02 336-342 DOI:10.1017/S1431927611012633

B. Goris, W. Van den Broek, K.J. Batenburg, H. Heidari Mezerji, S. Bals
Electron tomography based on a total variation minimization reconstruction technique
[article] Ultramicroscopy 113 120-130 DOI:10.1016/j.ultramic.2011.11.004

W. Van den Broek
Throughput Maximisation of Particle Size Measurements
[book chapter] From Scientific Instrument to Industrial Machine: Coping with Architectural Stress in Embedded Systems - Springer

W. Van den Broek, A. Rosenauer, B. Goris, G.T. Martinez, S. Bals, S. Van Aert, D. Van Dyck
Correction of non-linear thickness effects in HAADF STEM electron tomography
[article] Ultramicroscopy 116 8-12 DOI:10.1016/j.ultramic.2012.03.005

J. Verbeeck, A. Béché, W. Van den Broek
A holographic method to measure the source size broadening in STEM
[article] Ultramicroscopy 120 35-40 DOI:10.1016/j.ultramic.2012.05.007

B. Goris, S. Bals, W. Van den Broek, E. Carbó-Argibay, S. Gómez-Gra{\textbackslash}textbackslashña, L.M. Liz-Marzán, G. Van Tendeloo
Atomic-scale determination of surface facets in gold nanorods
[article] Nature Materials 11 11 930-935 DOI:10.1038/nmat3462

N. Talebi, R. Vogelgesang, L. Gu, W. Sigle, C.T. Koch, B. Ögüt, M. Rohm, L.M. Liz-Marzán, P.A. van Aken
Surface-plasmon modes and mode degeneracy in a triangular system
[conference proceedings] European Microscopy Congress EMC2012 in Manchester

V. Srot, U.G.K. Wegst, U. Salzberger, C.T. Koch, P.A. van Aken
Interfaces and contacts in natural composite materials
[conference proceedings] European Microscopy Congress EMC2012 in Manchester

W. Van den Broek, C.T. Koch
Feasibility study of atomic resolution tomography by charge flipping
[conference proceedings] European Microscopy Congress EMC2012 in Manchester

C.T. Koch
Full-Resolution Inline Electron Holography (FRIH)
[conference proceedings] European Microscopy Congress EMC2012 in Manchester

C.T. Koch
4D Electron Diffraction by Large-Angle Rocking-Beam Electron Diffraction (LARBED)
[conference proceedings] European Microscopy Congress EMC2012 in Manchester

X. Mu, W. Sigle, C.T. Koch, A. Bach, D. Fischer, N. Totò, S. Neelamraju, C. Schön, M. Jansen, P.A. van Aken
TEM study of the structural evolution of ionic solids from amorphous to polycrystalline phases in the case of alkali difluoride systems
[conference proceedings] European Microscopy Congress EMC2012 in Manchester

V. Srot, B. Bussmann, U. Salzberger, C.T. Koch, P.A. van Aken
Correlating microstructure and nanochemistry of human dental tissues
[conference proceedings] European Microscopy Congress EMC2012 in Manchester

C.T. Koch
Electron Holography without a Biprism
[conference proceedings] Conference Proceedings APMC 10 / ICONN 2012 / ACMM 22 in Perth

C.T. Koch
Aberration-Compensated Large-Angle Rocking-Beam Electron Diffraction (LARBED)
[conference proceedings] Conference Proceedings APMC 10 / ICONN 2012 / ACMM 22 in Perth

K. Song, C.T. Koch, G. Shin, J.K. Kim, S.H. Oh
Strain mapping of LED devices by dark-field inline electron holography
[conference proceedings] Conference Proceedings APMC 10 / ICONN 2012 / ACMM 22 in Perth

V.B. Özdöl, C.T. Koch, P.A. van Aken
TEM for Strain-engineered Devices: Dark-Field Inline Holography for Nanoscale Strain Mapping
[article] GIT Imaging and Microscopy 3 18-20

H. Rosner, C.T. Koch, P.A. van Aken
Strain Mapping at Al-Pb Interfaces: A Combination of HRTEM Focus Series Reconstruction and GPA
[article] GIT Imaging and Microscopy 1 40-43

C.T. Koch, V.B. ÖzdöL, K. Ishizuka
Quantitative 4-Dimensional Electron Diffraction in the TEM
[article] Microscopy and Analysis May 5-8

C.T. Koch
LARBED Exploring the Fourth Dimension in Electron Diffraction
[book chapter] Uniting Electron Crystallography and Powder Diffraction - NATO Science for Peace and Security Series B Physics and Biophysics Springer

C.T. Koch
High-Energy Electron Diffraction: Capabilities, Instrumentation, and Examples
[book chapter] Modern Diffraction Methods - Wiley-VCH Weinheim

A. Mogilatenko, G. Beddies, M. Falke, I. Häusler, W. Neumann
Microstructure analysis of novel ternary NiSi2-xAlx silicide layers on Si(001) formed by solid-state reaction
[article] Journal of Applied Physics 111 10 103512 DOI:10.1063/1.4718008

C.T. Koch
Conventional and Advanced Electron Transmission Microscopy
[book chapter] In-situ Electron Microscopy - Wiley-VCH Weinheim

G. Yuan, R. Mitdank, A. Mogilatenko, S.F. Fischer
Porous Nanostructures and Thermoelectric Power Measurement of Electro-Less Etched Black Silicon
[article] The Journal of Physical Chemistry C 116 25 13767-13773 DOI:10.1021/jp212427g

V. Kueller, A. Knauer, F. Brunner, A. Mogilatenko, M. Kneissl, M. Weyers
Investigation of inversion domain formation in AlN grown on sapphire by MOVPE
[article] physica status solidi (c) 9 3-4 496-498 DOI:10.1002/pssc.201100495

D. Abou-Ras, S.S. Schmidt, R. Caballero, T. Unold, H. Schock, C.T. Koch, B. Schaffer, M. Schaffer, P. Choi, O. Cojocaru-Mirédin
Confined and Chemically Flexible Grain Boundaries in Polycrystalline Compound Semiconductors
[article] Advanced Energy Materials 2 8 992-998 DOI:10.1002/aenm.201100764

W. Van den Broek, C.T. Koch
Method for Retrieval of the Three-Dimensional Object Potential by Inversion of Dynamical Electron Scattering
[article] Physical Review Letters 109 24 DOI:10.1103/PhysRevLett.109.245502

R. Fenger, E. Fertitta, H. Kirmse, A.F. Thünemann, K. Rademann
Size dependent catalysis with CTAB-stabilized gold nanoparticles
[article] Physical Chemistry Chemical Physics 14 26 9343 DOI:10.1039/c2cp40792b

N. Talebi, W. Sigle, R. Vogelgesang, C.T. Koch, C. Fernández-López, L.M. Liz-Marzán, B. Ögüt, M. Rohm, P.A. van Aken
Breaking the Mode Degeneracy of Surface Plasmon Resonances in a Triangular System
[article] Langmuir 28 24 8867-8873 DOI:10.1021/la3001762

W. Neumann, H. Kirmse, I. Häusler, C. Grosse, P. Moeck, S. Rouvimov, M. Beekman, R. Atkins, D.C. Johnson, K. Volz
Methods of Electron Crystallography as Tools for Materials Analysis
[article] Solid State Phenomena 186 1-6 DOI:10.4028/www.scientific.net/SSP.186.1

C.M. Schultz, P. Crump, A. Maasdorf, O. Brox, F. Bugge, A. Mogilatenko, H. Wenzel, S. Knigge, B. Sumpf, M. Weyers, G. Erbert, G. Tränkle
In situ etched gratings embedded in AlGaAs for efficient high power 970 nm distributed feedback broad-area lasers
[article] Applied Physics Letters 100 20 201115 DOI:10.1063/1.4718916

F. Brunner, A. Mogilatenko, A. Knauer, M. Weyers, J.-. Zettler
Analysis of doping induced wafer bow during GaN:Si growth on sapphire
[article] Journal of Applied Physics 112 3 033503 DOI:10.1063/1.4739278

J.L. Hernández-Rivera, J.J.C. Rivera, C.T. Koch, V.B. Özdöl, R. Martínez-Sánchez
Study of coherence strain of GP II zones in an aged aluminum composite
[article] Journal of Alloys and Compounds 536 S159-S164 DOI:10.1016/j.jallcom.2012.01.016

V. Kueller, A. Knauer, C. Reich, A. Mogilatenko, M. Weyers, J. Stellmach, T. Wernicke, M. Kneissl, Z. Yang, C.L. Chua, N.M. Johnson
Modulated Epitaxial Lateral Overgrowth of AlN for Efficient UV LEDs
[article] IEEE Photonics Technology Letters 24 18 1603-1605 DOI:10.1109/LPT.2012.2210542

2011

V. Srot, B. Bussmann, U. Salzberger, C. Koch, G. Čižmek, P. van Aken
Characterization of Dentine, Dentinal Tubules and Dentine-Enamel Junction in Human Teeth by Advanced Analytical TEM
[conference proceedings] Microscopy and Microanalysis 17 S2 286-287 DOI:10.1017/S1431927611002303

W. Sigle, L. Gu, N. Talebi, B. Ögüt, C. Koch, R. Vogelgesang, P. van Aken
EELS and EFTEM of Surface Plasmons in Metallic Nanostructures
[conference proceedings] Microscopy and Microanalysis 17 S2 762-763 DOI:10.1017/S1431927611004685

V. Özdöl, C. Koch, P. van Aken
Low-Dose Strain Mapping by Dark-Field Inline Electron Holography
[conference proceedings] Microscopy and Microanalysis 17 S2 1228-1229 DOI:10.1017/S143192761100701X

2010

P. van Aken, W. Sigle, C. Koch, B. Ögüt, J. Nelayah, L. Gu
Low-loss EFTEM Imaging of Surface Plasmon Resonances in Ag Nanostructures
[conference proceedings] Microscopy and Microanalysis 16 S2 1438-1439 DOI:10.1017/S1431927610056242

V. Srot, U. Wegst, U. Salzberger, C. Koch, P. van Aken
ELNES Investigations of Interfaces in Abalone Shell
[conference proceedings] Microscopy and Microanalysis 16 S2 1218-1219 DOI:10.1017/S1431927610057314

N. Jin-Phillipp, C. Koch, P. van Aken
3D Elemental Mapping in Nanomaterials by Core-Loss EFTEM Tomography
[conference proceedings] Microscopy and Microanalysis 16 S2 1842-1843 DOI:10.1017/S1431927610056357

V. Özdöl, C. Koch, P. van Aken
Strain Mapping of 45 nm MOSFET by Dark-Field Inline Electron Holography
[conference proceedings] Microscopy and Microanalysis 16 S2 592-593 DOI:10.1017/S1431927610057090

C. Koch
Quantitative Analysis of Crystal Defects: Towards 3-Dimensional Imaging of Charge Densities and Atomic Structure by Inline Electron Holography
[conference proceedings] Microscopy and Microanalysis 16 S2 1478-1479 DOI:10.1017/S1431927610057089

2009

2008

W. Sigle, L. Gu, C. Koch, V. Srot, J. Nelayah, P.V. Aken
Application of Monochromated Electrons in EELS
[conference proceedings] Microscopy and Microanalysis 14 S2 134-135 DOI:10.1017/S1431927608084420

2007

E. Essers, M. Matijevic, G. Benner, R. Höschen, W. Sigle, C. Koch
Analytical Performance of the SESAM Microscope
[conference proceedings] Microscopy and Microanalysis 13 S03 DOI:10.1017/S1431927607080099

C.T. Koch, B. Rahmati, P.A.v. Aken, M. Rühle, M. Bäurer, M. Hoffmann
Mapping Grain Boundary Potentials by Inline Electron Holography
[conference proceedings] Microscopy and Microanalysis 13 S03 DOI:10.1017/S1431927607081676

P.v. Aken, C. Koch, W. Sigle, R. Höschen, M. Rühle, E. Essers, G. Benner, M. Matijevic
The Sub-Electron-Volt-Sub-Angstrom-Microscope (SESAM): Pushing the Limits in Monochromated and Energy-Filtered TEM.
[conference proceedings] Microscopy and Microanalysis 13 S02 DOI:10.1017/S1431927607071942

W. Sigle, L. Gu, V. Srot, C. Koch, P.A.v. Aken
Low-loss EELS with Monochromated Electrons
[conference proceedings] Microscopy and Microanalysis 13 S03 DOI:10.1017/S1431927607080270

C.T. Koch
Solving the dynamic inversion problem
[conference proceedings] Microscopy and Microanalysis 13 S03 DOI:10.1017/S1431927607080592

2006

C.T. Koch, S. Bhattacharyya, M. Rühle, R.L. Satet, M.J. Hoffmann
Measuring Electrostatic Potential Profiles across Amorphous Intergranular Films by Electron Diffraction
[article] Microscopy and Microanalysis 12 2 160-169 DOI:10.1017/S1431927606060132

E. Essers, R. Hoeschen, M. Matijevic, G. Benner, C. Koch
Requisites for Ultimate Energy Resolution EELS and Band Gap Measurements
[conference proceedings] Microscopy and Microanalysis 12 S02 1148-1149 DOI:10.1017/S1431927606068905

S. Bhattacharyya, C. Koch, M. Rühle
Determination of Projected Potential Profiles Across Interfaces Using Through Focal Series Reconstruction
[conference proceedings] Microscopy and Microanalysis 12 S02 1016-1017 DOI:10.1017/S1431927606064701

C.T. Koch, W. Sigle, R. Höschen, M. Rühle, E. Essers, G. Benner, M. Matijevic
SESAM: Exploring the Frontiers of Electron Microscopy
[article] Microscopy and Microanalysis 12 6 506-514 DOI:10.1017/S1431927606060624

2005

2004

C.T. Koch, S. Bhattacharyya, A. Subramaniam, M. Rühle
Assessing Thermodynamic Properties of Amorphous Nanostructures by Energy-Filtered Electron Diffraction
[conference proceedings] Microscopy and Microanalysis 10 S02 254-255 DOI:10.1017/S1431927604881492

C.T. Koch
Solving the Phase Problem for Electron Diffraction of Non-Centrosymmetric Two-Dimensional Organic Crystals Using the Example of Membrane Proteins
[conference proceedings] Microscopy and Microanalysis 10 S02 414-415 DOI:10.1017/S1431927604881509

2003

C.T. Koch, M. Rühle
Numerical Nanodiffraction of Amorphous Grain Boundary Films
[conference proceedings] Microscopy and Microanalysis 9 S03 44-45 DOI:10.1017/S1431927603012066

G.G. Hembree, C. Koch, J.C.H. Spence
A Quantitative Nanodiffraction System for Ultrahigh Vacuum Scanning Transmission Electron Microscopy
[article] Microscopy and Microanalysis 9 5 468-474 DOI:10.1017/S1431927603030149